Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection
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Published By Springer Berlin Heidelberg

9783642006227, 9783642006234

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Ion Spectrometers and Detectors

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_33 ◽

2009 ◽

pp. 421-429

Author(s):

Tessica D.M. Weijers-Dall

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Box 7: Diagnostic Ion Beam Luminescence

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_16 ◽

2009 ◽

pp. 211-217

Author(s):

Peter Townsend

Keyword(s):

Ion Beam ◽

Diagnostic Ion

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Box 13: Silicon Micro/Nano-Fabrication Using Proton Beam Writing and Electrochemical Etching

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_27 ◽

2009 ◽

pp. 323-328

Author(s):

Daniel J. Blackwood ◽

Ee Jin Teo

Keyword(s):

Proton Beam ◽

Electrochemical Etching ◽

Nano Fabrication ◽

Proton Beam Writing

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Box 8: Sample Preparation for Transmission Electron Microscopy Using a Focused Ion Beam

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_21 ◽

2009 ◽

pp. 291-292

Author(s):

Lumin Wang ◽

Yongqi Fu

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Sample Preparation ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron

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Nanoscale Engineering in the Biosciences

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_1 ◽

2009 ◽

pp. 3-20 ◽

Cited By ~ 2

Author(s):

Daniel J. White ◽

Harry J. Whitlow

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Basics of Ion Scattering in Nanoscale Materials

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_4 ◽

2009 ◽

pp. 69-86

Author(s):

Harry J. Whitlow ◽

Yanwen Zhang

Keyword(s):

Nanoscale Materials ◽

Ion Scattering

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Nanoscale Materials Defect Characterisation

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_14 ◽

2009 ◽

pp. 185-204

Author(s):

Eduardo Alves ◽

Mark Breese

Keyword(s):

Nanoscale Materials ◽

Defect Characterisation

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Nanoscale Materials Modification for Device Applications

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_28 ◽

2009 ◽

pp. 329-355

Author(s):

Robert G. Elliman

Keyword(s):

Nanoscale Materials ◽

Device Applications

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Box 10: Proton Beam Writing of Optical Structures

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_24 ◽

2009 ◽

pp. 311-314

Author(s):

Andrew A. Bettiol

Keyword(s):

Proton Beam ◽

Proton Beam Writing

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Characterising Nanoscale Crystal Perfection by Crystal Mapping

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection ◽

10.1007/978-3-642-00623-4_9 ◽

2009 ◽

pp. 129-145 ◽

Cited By ~ 1

Author(s):

Sachiko T. Nakagawa

Keyword(s):

Crystal Perfection

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Ion Beams in Nanoscience and Technology - Particle Acceleration and DetectionLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Ion Spectrometers and Detectors

Box 7: Diagnostic Ion Beam Luminescence

Box 13: Silicon Micro/Nano-Fabrication Using Proton Beam Writing and Electrochemical Etching

Box 8: Sample Preparation for Transmission Electron Microscopy Using a Focused Ion Beam

Nanoscale Engineering in the Biosciences

Basics of Ion Scattering in Nanoscale Materials

Nanoscale Materials Defect Characterisation

Nanoscale Materials Modification for Device Applications

Box 10: Proton Beam Writing of Optical Structures

Characterising Nanoscale Crystal Perfection by Crystal Mapping

Ion Beams in Nanoscience and Technology - Particle Acceleration and Detection
Latest Publications