A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing
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Published By Kluwer Academic Publishers

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Test Pattern Generation

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_4 ◽

2005 ◽

pp. 61-80

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation

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Merging BIST and Concurrent Fault Detection

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_15 ◽

2005 ◽

pp. 267-286

Keyword(s):

Fault Detection

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An Overview of BIST

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_1 ◽

2005 ◽

pp. 1-14

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Pseudo-Exhaustive BIST

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_8 ◽

2005 ◽

pp. 137-148

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Circular BIST

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_9 ◽

2005 ◽

pp. 149-168

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Non-Intrusive BIST

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_11 ◽

2005 ◽

pp. 191-206

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Design for Testability

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_3 ◽

2005 ◽

pp. 43-60

Keyword(s):

Design For Testability

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Manufacturing and System-Level Use of BIST

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_6 ◽

2005 ◽

pp. 101-120

Keyword(s):

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BIST for Regular Structures

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_12 ◽

2005 ◽

pp. 207-220

Keyword(s):

Regular Structures

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Built-In Logic Block Observer

A Designer’s Guide to Built-In Self-Test - Frontiers in Electronic Testing ◽

10.1007/0-306-47504-9_7 ◽

2005 ◽

pp. 121-136

Keyword(s):

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