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Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
Latest Publications
TOTAL DOCUMENTS
69
(FIVE YEARS 0)
H-INDEX
4
(FIVE YEARS 0)
Published By IEEE
9781479913145, 9781479913121
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
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Mu-GSIM: A mutation testing simulator on GPUs
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643604
◽
2013
◽
Cited By ~ 1
Author(s):
Jason G. Tong
◽
Marc Boule
◽
Zeljko Zilic
Keyword(s):
Mutation Testing
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Innovative solutions for Package on Package test
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643580
◽
2013
◽
Author(s):
Chin Chien Tee
◽
Siang Soh
Keyword(s):
Innovative Solutions
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A new TSV set architecture for high reliability
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643574
◽
2013
◽
Cited By ~ 1
Author(s):
Jaeseok Park
◽
Sungho Kang
Keyword(s):
High Reliability
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Detecting resistive-opens in RRAM using Programmable DfT scheme
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643558
◽
2013
◽
Author(s):
Nor Zaidi Haron
◽
Norsuhaidah Arshad
◽
Sukreen Hana Herman
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Simultaneous hotspot temperature and supply noise reductions using thermal TSVs and decoupling capacitors
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643595
◽
2013
◽
Author(s):
Yan-Wun Wang
◽
Pao-Jen Huang
◽
Tai-Chen Chen
◽
Chien-Nan Jimmy Liu
Keyword(s):
Decoupling Capacitors
◽
Supply Noise
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Call for papers
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643551
◽
2013
◽
Download Full-text
Breakthrough of micro USB placement in printed circuit board
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643583
◽
2013
◽
Author(s):
Kent Lee
◽
Yow Huoy Thyng
◽
Oliver Hooi
Keyword(s):
Printed Circuit Board
◽
Circuit Board
◽
Printed Circuit
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[Back cover]
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643612
◽
2013
◽
Keyword(s):
Back Cover
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Path resistance reduction through automated Multi-Level Metal and Via insertion for IC layout design
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643597
◽
2013
◽
Author(s):
Thai Lee Lo
◽
Gregory Sylvester Emmanuel
◽
Thomas Fong Chee Goh
◽
Chun Keong Lee
◽
Joon Heong Ong
◽
...
Keyword(s):
Layout Design
◽
Resistance Reduction
◽
Multi Level
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Optimized clock gating cell for low power design in nanoscale CMOS technology
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)
◽
10.1109/asqed.2013.6643569
◽
2013
◽
Cited By ~ 2
Author(s):
Aniryudh Reddy Durgam
◽
Ken Choi
Keyword(s):
Low Power
◽
Low Power Design
◽
Cmos Technology
◽
Clock Gating
◽
Nanoscale Cmos
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