Characterization of Semiconductor Heterostructures and Nanostructures
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Dedication

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.03001-6 ◽

2013 ◽

pp. v

Author(s):

Carlo Lamberti

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Cathodoluminescence of Self-assembled Nanosystems

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00013-3 ◽

2013 ◽

pp. 557-601 ◽

Author(s):

Giancarlo Salviati ◽

Filippo Fabbri ◽

Francesca Detto ◽

Francesca Rossi ◽

Laura Lazzarini ◽

...

Keyword(s):

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Ab initio Studies of Structural and Electronic Properties

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00002-9 ◽

2013 ◽

pp. 21-73 ◽

Author(s):

Maria Peressi ◽

Alfonso Baldereschi

Keyword(s):

Ab Initio ◽

Electronic Properties ◽

Structural And Electronic Properties

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Index

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.18001-x ◽

2013 ◽

pp. 803-813

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Electron Spin Resonance of Interfaces and Nanolayers in Semiconductor Heterostructures

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00016-9 ◽

2013 ◽

pp. 685-752 ◽

Author(s):

Andre Stesmans ◽

Valery V. Afanas’ev

Keyword(s):

Electron Spin Resonance ◽

Electron Spin ◽

Semiconductor Heterostructures ◽

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The Role of Photoemission Spectroscopies in Heterojunction Research

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00014-5 ◽

2013 ◽

pp. 603-639

Author(s):

G. Margaritondo

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Micro- and Nano-X-ray Beams

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00009-1 ◽

2013 ◽

pp. 361-412 ◽

Author(s):

Gema Martinez-Criado ◽

Elisa Borfecchia ◽

Lorenzo Mino ◽

Carlo Lamberti

Keyword(s):

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Electrical and Electro-Optical Characterization of Semiconductor Nanowires

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00015-7 ◽

2013 ◽

pp. 641-684 ◽

Author(s):

Lorenzo Rigutti ◽

Maria Tchernycheva

Keyword(s):

Optical Characterization ◽

Semiconductor Nanowires

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Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00008-x ◽

2013 ◽

pp. 311-359 ◽

Author(s):

H. Renevier ◽

M.G. Proietti

Keyword(s):

Fine Structure ◽

Structural Properties ◽

Grazing Incidence ◽

Grazing Incidence Diffraction

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Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams

Characterization of Semiconductor Heterostructures and Nanostructures ◽

10.1016/b978-0-444-59551-5.00004-2 ◽

2013 ◽

pp. 113-173 ◽

Author(s):

Tobias Schülli ◽

Vincent Favre-Nicolin ◽

Marie-Ingrid Richard ◽

Gilles Renaud

Keyword(s):

X Ray ◽

X Ray Scattering ◽

Focused Beams ◽

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