2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)
Latest Publications

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9781538660638

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Classification of Polarizing Matrices Based on Bhattacharyya Parameters

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693130 ◽

2018 ◽

Author(s):

Lei Cheng ◽

Lijun Zhang ◽

Qiang Sun

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Research on NVIDIA Deep Learning Accelerator

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693202 ◽

2018 ◽

Cited By ~ 1

Author(s):

Gaofeng Zhou ◽

Jianyang Zhou ◽

Haijun Lin

Keyword(s):

Deep Learning

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Novel Binary Adaptive Morphological Operators

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693227 ◽

2018 ◽

Author(s):

Yanbo Li ◽

Junping Wang

Keyword(s):

Morphological Operators

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Digital Filter Design of A High Resolution Audio Sigma-delta ADC

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693141 ◽

2018 ◽

Cited By ~ 1

Author(s):

Qifeng Huang ◽

Peiyuan Wan ◽

Xuesong Xie ◽

Chuankai Wang ◽

Limei Su ◽

...

Keyword(s):

High Resolution ◽

Digital Filter ◽

Filter Design ◽

Sigma Delta ◽

Digital Filter Design ◽

Sigma Delta Adc

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Quantitative Analysis on Mathematical Morphology

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693120 ◽

2018 ◽

Cited By ~ 1

Author(s):

Junping Wang ◽

Yiping Pan ◽

Yanbo Li ◽

Lulu Zhao

Keyword(s):

Quantitative Analysis ◽

Mathematical Morphology

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Improving the Quality of Crowdsourcing Labels by Combination of Golden Data and Incentive

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693123 ◽

2018 ◽

Author(s):

Peijun Yang ◽

Haibin Cai ◽

Zhiming Zheng

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Plate Recognition Based on Deep Learning

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693122 ◽

2018 ◽

Author(s):

Ling Tang ◽

Zhibin Gao ◽

Lianfen Huang

Keyword(s):

Deep Learning

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A Novel SPA on ECC with Modular Subtraction

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693138 ◽

2018 ◽

Cited By ~ 1

Author(s):

Yanzhao Yin ◽

Liji Wu ◽

Qian Peng ◽

Xiangmin Zhang

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Analysis of Electrostatic Discharge Parameters Affected by Velocity of Electrodes Based on Neural Network

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693142 ◽

2018 ◽

Author(s):

Sheng Guan ◽

Fangming Ruan ◽

Ming Su ◽

Heng Wang

Keyword(s):

Neural Network ◽

Electrostatic Discharge ◽

Discharge Parameters

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Design of Wearable Power Management Circuit with Improved Beta-Multiplier Voltage Reference

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID) ◽

10.1109/icasid.2018.8693237 ◽

2018 ◽

Author(s):

Shuaiyu Mao ◽

Wensi Wang ◽

Yun Liu ◽

Zhijie Chen

Keyword(s):

Power Management ◽

Voltage Reference

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2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Classification of Polarizing Matrices Based on Bhattacharyya Parameters

Research on NVIDIA Deep Learning Accelerator

Novel Binary Adaptive Morphological Operators

Digital Filter Design of A High Resolution Audio Sigma-delta ADC

Quantitative Analysis on Mathematical Morphology

Improving the Quality of Crowdsourcing Labels by Combination of Golden Data and Incentive

Plate Recognition Based on Deep Learning

A Novel SPA on ECC with Modular Subtraction

Analysis of Electrostatic Discharge Parameters Affected by Velocity of Electrodes Based on Neural Network

Design of Wearable Power Management Circuit with Improved Beta-Multiplier Voltage Reference

2018 12th IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)
Latest Publications