2010 IEEE 16th International On-Line Testing Symposium
Latest Publications

TOTAL DOCUMENTS

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Published By IEEE

9781424477241

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Robust FSMs for cryptographic devices resilient to strong fault injection attacks

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560195 ◽

2010 ◽

Cited By ~ 8

Author(s):

Zhen Wang ◽

Mark Karpovsky

Keyword(s):

Fault Injection ◽

Injection Attacks ◽

Fault Injection Attacks

Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560198 ◽

2010 ◽

Cited By ~ 2

Author(s):

M. Nicolaidis ◽

Vladimir Pasca ◽

Lorena Anghel

Keyword(s):

Integrated Systems ◽

Self Repair

Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560228 ◽

2010 ◽

Author(s):

Michael G. Dimopoulos ◽

Alexios D. Spyronasios ◽

Alkis A. Hatzopoulos

Keyword(s):

Wavelet Analysis ◽

Mixed Signal ◽

Mixed Signal Circuits ◽

On Line

A method for detecting resistive opens in buses

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560210 ◽

2010 ◽

Author(s):

Josep Rius

Online fault testing of reversible logic using dual rail coding

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560205 ◽

2010 ◽

Cited By ~ 22

Author(s):

Navid Farazmand ◽

Masoud Zamani ◽

Mehdi B. Tahoori

Keyword(s):

Reversible Logic ◽

Fault Testing

Trustworthy computing in a multi-core system using distributed scheduling

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560200 ◽

2010 ◽

Cited By ~ 10

Author(s):

D. McIntyre ◽

F. Wolff ◽

C. Papachristou ◽

S. Bhunia

Keyword(s):

Distributed Scheduling ◽

Core System ◽

Trustworthy Computing

Selecting state variables for improved on-line testability through output response comparison of identical circuits

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560213 ◽

2010 ◽

Cited By ~ 2

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

State Variables ◽

Output Response ◽

On Line

A new framework for the automatic insertion of mitigation structures in circuits netlists

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560211 ◽

2010 ◽

Cited By ~ 1

Author(s):

Niccolo Battezzati ◽

Davide Serrone ◽

Massimo Violante

Keyword(s):

New Framework

Robust cryptographic ciphers with on-line statistical properties validation

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560203 ◽

2010 ◽

Cited By ~ 3

Author(s):

Anna Vaskova ◽

Celia Lopez-Ongil ◽

Alejandro Jimenez-Horas ◽

Enrique San Millan ◽

Luis Entrena

Keyword(s):

Statistical Properties ◽

On Line

Application dependent FPGA testing method using compressed deterministic test vectors

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560208 ◽

2010 ◽

Cited By ~ 1

Author(s):

Martin Rozkovec ◽

Jiri Jenicek ◽

Ondrej Novak

Keyword(s):

Testing Method ◽

Test Vectors ◽

Fpga Testing

2010 IEEE 16th International On-Line Testing SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Robust FSMs for cryptographic devices resilient to strong fault injection attacks

Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems

Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits

A method for detecting resistive opens in buses

Online fault testing of reversible logic using dual rail coding

Trustworthy computing in a multi-core system using distributed scheduling

Selecting state variables for improved on-line testability through output response comparison of identical circuits

A new framework for the automatic insertion of mitigation structures in circuits netlists

Robust cryptographic ciphers with on-line statistical properties validation

Application dependent FPGA testing method using compressed deterministic test vectors

2010 IEEE 16th International On-Line Testing Symposium
Latest Publications