2010 IEEE 16th International On-Line Testing Symposium
Latest Publications

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Published By IEEE

9781424477241

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Robust FSMs for cryptographic devices resilient to strong fault injection attacks

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560195 ◽

2010 ◽

Cited By ~ 8

Author(s):

Zhen Wang ◽

Mark Karpovsky

Keyword(s):

Fault Injection ◽

Injection Attacks ◽

Fault Injection Attacks

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Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560198 ◽

2010 ◽

Cited By ~ 2

Author(s):

M. Nicolaidis ◽

Vladimir Pasca ◽

Lorena Anghel

Keyword(s):

Integrated Systems ◽

Self Repair

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Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560228 ◽

2010 ◽

Author(s):

Michael G. Dimopoulos ◽

Alexios D. Spyronasios ◽

Alkis A. Hatzopoulos

Keyword(s):

Wavelet Analysis ◽

Mixed Signal ◽

Mixed Signal Circuits ◽

On Line

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A method for detecting resistive opens in buses

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560210 ◽

2010 ◽

Author(s):

Josep Rius

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Online fault testing of reversible logic using dual rail coding

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560205 ◽

2010 ◽

Cited By ~ 22

Author(s):

Navid Farazmand ◽

Masoud Zamani ◽

Mehdi B. Tahoori

Keyword(s):

Reversible Logic ◽

Fault Testing

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Trustworthy computing in a multi-core system using distributed scheduling

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560200 ◽

2010 ◽

Cited By ~ 10

Author(s):

D. McIntyre ◽

F. Wolff ◽

C. Papachristou ◽

S. Bhunia

Keyword(s):

Distributed Scheduling ◽

Core System ◽

Trustworthy Computing

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Selecting state variables for improved on-line testability through output response comparison of identical circuits

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560213 ◽

2010 ◽

Cited By ~ 2

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

State Variables ◽

Output Response ◽

On Line

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A new framework for the automatic insertion of mitigation structures in circuits netlists

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560211 ◽

2010 ◽

Cited By ~ 1

Author(s):

Niccolo Battezzati ◽

Davide Serrone ◽

Massimo Violante

Keyword(s):

New Framework

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Robust cryptographic ciphers with on-line statistical properties validation

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560203 ◽

2010 ◽

Cited By ~ 3

Author(s):

Anna Vaskova ◽

Celia Lopez-Ongil ◽

Alejandro Jimenez-Horas ◽

Enrique San Millan ◽

Luis Entrena

Keyword(s):

Statistical Properties ◽

On Line

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Application dependent FPGA testing method using compressed deterministic test vectors

2010 IEEE 16th International On-Line Testing Symposium ◽

10.1109/iolts.2010.5560208 ◽

2010 ◽

Cited By ~ 1

Author(s):

Martin Rozkovec ◽

Jiri Jenicek ◽

Ondrej Novak

Keyword(s):

Testing Method ◽

Test Vectors ◽

Fpga Testing

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2010 IEEE 16th International On-Line Testing SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Robust FSMs for cryptographic devices resilient to strong fault injection attacks

Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems

Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits

A method for detecting resistive opens in buses

Online fault testing of reversible logic using dual rail coding

Trustworthy computing in a multi-core system using distributed scheduling

Selecting state variables for improved on-line testability through output response comparison of identical circuits

A new framework for the automatic insertion of mitigation structures in circuits netlists

Robust cryptographic ciphers with on-line statistical properties validation

Application dependent FPGA testing method using compressed deterministic test vectors

2010 IEEE 16th International On-Line Testing Symposium
Latest Publications