2015 IEEE International Test Conference (ITC)
Latest Publications

TOTAL DOCUMENTS

59

(FIVE YEARS 0)

H-INDEX

9

(FIVE YEARS 0)

Published By IEEE

9781467365789

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A self-compensating built-in self-test solution for RF phased array mismatch

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342414 ◽

2015 ◽

Author(s):

Jae Woong Jeong ◽

Jennifer Kitchen ◽

Sule Ozev

Keyword(s):

Phased Array ◽

Test Solution ◽

Self Test ◽

Built In Self Test

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Tolerance analysis of fixture fabrication, from drilling holes to pointing accuracy

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342401 ◽

2015 ◽

Author(s):

An-Jim Long ◽

David Tsai ◽

Kent Lien ◽

Steve Hsu

Keyword(s):

Tolerance Analysis ◽

Pointing Accuracy

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Platform IO and system memory test using L3 cache based test (CBT) and parallel execution of CPGC Intel BIST engine

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342399 ◽

2015 ◽

Author(s):

Bruce Querbach ◽

Tan Peter Yanyang ◽

Lovelace Van ◽

David Blankenbeckler ◽

Rahul Khanna ◽

...

Keyword(s):

Memory Test ◽

Parallel Execution ◽

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Developing a modern platform for test engineering — Introducing the origen semiconductor developer's kit

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342393 ◽

2015 ◽

Author(s):

Stephen McGinty ◽

Daniel Hadad ◽

Chris Nappi ◽

Brian Caquelin

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Contactless pre-bond TSV fault diagnosis using duty-cycle detectors and ring oscillators

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342389 ◽

2015 ◽

Author(s):

Sergej Deutsch ◽

Krishnendu Chakrabarty

Keyword(s):

Fault Diagnosis ◽

Ring Oscillators

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eRNA: Refining of reconstructed digital waveform

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342392 ◽

2015 ◽

Author(s):

Hideo Okawara

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A DLL-based test solution for through silicon via (TSV) in 3D-stacked ICs

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342390 ◽

2015 ◽

Author(s):

Rashid Rashidzadeh ◽

Esrafil Jedari ◽

Tareq Muhammad Supon ◽

Vladimir Mashkovtsev

Keyword(s):

Test Solution ◽

Through Silicon Via

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Hardware in loop testing of an insulin pump

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342416 ◽

2015 ◽

Author(s):

Sriram Karunagaran ◽

Karuna P. Sahoo ◽

Masahiro Fujita

Keyword(s):

Insulin Pump ◽

Hardware In Loop

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Concurrent hardware Trojan detection in wireless cryptographic ICs

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342386 ◽

2015 ◽

Author(s):

Yu Liu ◽

Georgios Volanis ◽

Ke Huang ◽

Yiorgos Makris

Keyword(s):

Hardware Trojan ◽

Hardware Trojan Detection ◽

Trojan Detection

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Technical program committee

2015 IEEE International Test Conference (ITC) ◽

10.1109/test.2015.7342371 ◽

2015 ◽

Keyword(s):

Program Committee ◽

Technical Program Committee ◽

Technical Program

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