Modeling Aspects in Optical Metrology VII
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57
(FIVE YEARS 57)

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2
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Published By SPIE

9781510627932, 9781510627949
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Numerical optimization of resonant photonic devices (Conference Presentation)

2019 ◽  
Author(s):  
Martin Hammerschmidt ◽  
Lin Zschiedrich ◽  
Philipp-Immanuel Schneider ◽  
Felix Binkowski ◽  
Sven Burger
Keyword(s):  
Numerical Optimization ◽  
Photonic Devices

Transmission telescope optical metrology (Conference Presentation)

2019 ◽  
Author(s):  
Viviana Vladutescu ◽  
Aaron J. Swank ◽  
Dzu K. Le ◽  
Calvin R. Robinson ◽  
Félix A. Miranda ◽  
...  
Keyword(s):  
Optical Metrology

Hyperspectral imager calibration using ceramic color tiles (Conference Presentation)

2019 ◽  
Author(s):  
Matti A. Eskelinen ◽  
Clarence J. Zarobila ◽  
David W. Allen
Keyword(s):  
Ceramic Color

Physical optics modeling of interferometer-based metrology systems (Conference Presentation)

2019 ◽  
Author(s):  
Site Zhang ◽  
Huiying Zhong ◽  
Rui Shi ◽  
Christian Hellmann ◽  
Frank Wyrowski
Keyword(s):  
Physical Optics

An improved method to derive best-fit parameters and their uncertainties from depolarizing Mueller-matrices (Conference Presentation)

2019 ◽  
Author(s):  
Tobias Grunewald ◽  
Matthias Wurm ◽  
Sven Teichert ◽  
Bernd Bodermann ◽  
Johanna Reck ◽  
...  
Keyword(s):  
Improved Method ◽  
Mueller Matrices ◽  
Best Fit
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