scholarly journals Total Internal Reflection Geometry: Exploiting Total Internal Reflection Geometry for Terahertz Devices and Enhanced Sample Characterization (Advanced Optical Materials 3/2020)

2020 ◽  
Vol 8 (3) ◽  
pp. 2070012
Author(s):  
Qiushuo Sun ◽  
Xuequan Chen ◽  
Xudong Liu ◽  
Rayko I. Stantchev ◽  
Emma Pickwell‐MacPherson
2019 ◽  
Vol 8 (3) ◽  
pp. 1900535 ◽  
Author(s):  
Qiushuo Sun ◽  
Xuequan Chen ◽  
Xudong Liu ◽  
Rayko I. Stantchev ◽  
Emma Pickwell‐MacPherson

ACS Photonics ◽  
2016 ◽  
Vol 4 (1) ◽  
pp. 121-126 ◽  
Author(s):  
Yoichi Harada ◽  
Muhammad Shoufie Ukhtary ◽  
Minjie Wang ◽  
Sanjay K. Srinivasan ◽  
Eddwi H. Hasdeo ◽  
...  

2020 ◽  
Vol 217 (20) ◽  
pp. 2000315
Author(s):  
Noah J. Kramer ◽  
Lars F. Voss ◽  
Adam M. Conway ◽  
Paulius V. Grivickas ◽  
Mihail Bora ◽  
...  

2021 ◽  
Author(s):  
J. K. Asane ◽  
Md G. R. Chowdhury ◽  
K. M. Khabir ◽  
V. A. Podolskiy ◽  
M. A. Noginov

2016 ◽  
Vol 5 (3) ◽  
pp. 1600697 ◽  
Author(s):  
Xudong Liu ◽  
Zefeng Chen ◽  
Edward P. J. Parrott ◽  
Benjamin S.-Y. Ung ◽  
Jianbin Xu ◽  
...  

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