On the Mechanism of the Reaction of Organic Azides with Transition Metals: Evidence for Triplet Nitrene Capture

2005 ◽  
Vol 117 (38) ◽  
pp. 6359-6363 ◽  
Author(s):  
Mahdi M. Abu-Omar ◽  
Catherine E. Shields ◽  
Nicola Y. Edwards ◽  
Rebecca A. Eikey
2005 ◽  
Vol 44 (38) ◽  
pp. 6203-6207 ◽  
Author(s):  
Mahdi M. Abu-Omar ◽  
Catherine E. Shields ◽  
Nicola Y. Edwards ◽  
Rebecca A. Eikey

Author(s):  
R.W. Carpenter

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.


1971 ◽  
Vol 32 (C1) ◽  
pp. C1-74-C1-75 ◽  
Author(s):  
K. ENDO ◽  
Y. FUJITA ◽  
R. KIMURA ◽  
T. OHOYAMA ◽  
M. TERADA

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