One of the dominant trends in current research in materials science and related fields is the fabrication, characterization, and application of materials and device structures whose characteristic feature sizes are at or near the nanometer scale. Achieving an understanding of—and ultimately control over—the properties and behavior of a wide range of materials at the nanometer scale has therefore become a major theme in materials research. As our ability to synthesize materials and fabricate structures in this size regime improves, effective characterization of materials at the nanometer scale will continue to increase in importance.Central to this activity are the development and application of effective experimental techniques for performing characterization of structural, electronic, magnetic, optical, and other properties of materials with nanometer-scale spatial resolution. Two classes of experimental methods have proven to be particularly effective: scanning-probe techniques and electron microscopy. In this issue of MRS Bulletin, we have included eight articles that illustrate the elucidation of various aspects of nanometer-scale material properties using advanced scanningprobe or electron-microscopy techniques. Because the range of both experimental techniques and applications is extremely broad—and rapidly increasing—our intent is to provide several examples rather than a comprehensive treatment of this extremely active and rapidly growing field of research.
Binney/Dowrick: The Theory of Critical Phenomena/Brown: Quantum Field Theory/Lifshin: Materials Science and Technology: Vol. 2A, Characterization of Materials, Part I/Cowley: Electron Diffraction Techniques, Volume 1/Bellac: Quantum and Statistical Field
