Qualimetry Essentials Applied to Embedded Software Development

Insight ◽  
2021 ◽  
Vol 24 (4) ◽  
pp. 22-24
Author(s):  
Yann Argotti ◽  
Claude Baron ◽  
Phillipe Esteban
2010 ◽  
Vol 130 (3) ◽  
pp. 496-502
Author(s):  
Yoshiyuki Anan ◽  
Toyoshiro Nakashima ◽  
Kazunori Iwata ◽  
Hiroshi Yonemitsu ◽  
Tetsu Yoshioka ◽  
...  

Author(s):  
Gabriel de Souza Pereira Moreira ◽  
Denis Ávila Montini ◽  
Daniela América da Silva ◽  
Felipe Rafael Motta Cardoso ◽  
Luiz Alberto Vieira Dias ◽  
...  

Computer ◽  
2006 ◽  
Vol 39 (1) ◽  
pp. 55-61 ◽  
Author(s):  
J.W. Rottman

2014 ◽  
Vol 2 (3) ◽  
pp. 40-50 ◽  
Author(s):  
Kazunori Iwata ◽  
Toyoshiro Nakasima ◽  
Yoshiyuki Anan ◽  
Naohiro Ishii

Previous investigation focused on the prediction of total and errors for embedded software development projects using an artificial neural network (ANN). However, methods using ANNs have reached their improvement limits, since an appropriate value is estimated using what is known as point estimation in statistics. This paper proposes a method for predicting the number of errors for embedded software development projects using interval estimation provided by a support vector machine and ANN.


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