Enhanced performance in the deteriorated area of multicrystalline silicon wafers by internal gettering

About the relevance of defect features in as-cut multicrystalline silicon wafers on solar cell performance

10.1063/1.5049330 ◽

2018 ◽

Cited By ~ 2

Author(s):

Aditya Kovvali ◽

Matthias Demant ◽

Theresa Trötschler ◽

Jonas Haunschild ◽

Stefan Rein

Keyword(s):

Solar Cell ◽

Silicon Wafers ◽

Cell Performance ◽

Solar Cell Performance

INFRARED LBIC SCAN MAPS APPLIED TO ALUMINIUM GETTERED MULTICRYSTALLINE SILICON WAFERS

Journal de Physique IV (Proceedings) ◽

10.1051/jp4:1991637 ◽

1991 ◽

Vol 01 (C6) ◽

pp. C6-237-C6-238 ◽

Cited By ~ 1

Author(s):

J. Y. NATOLI ◽

M. PASQUINELLI ◽

F. FLORET ◽

S. MARTINUZZI

Keyword(s):

Silicon Wafers ◽

Texturisation of multicrystalline silicon wafers for solar cells by reactive ion etching through colloidal masks

Solar Energy Materials and Solar Cells ◽

10.1016/s0927-0248(02)00214-3 ◽

2003 ◽

Vol 76 (2) ◽

pp. 155-166 ◽

Cited By ~ 52

Author(s):

W.A. Nositschka ◽

C. Beneking ◽

O. Voigt ◽

H. Kurz

Keyword(s):

Solar Cells ◽

Reactive Ion Etching ◽

Silicon Wafers ◽

Ion Etching

Texture for Diamond Wire Sawn Multicrystalline Silicon Wafers by a Vapor Etching Method

ACTA PHOTONICA SINICA ◽

10.3788/gzxb20154401.0116002 ◽

2015 ◽

Vol 44 (1) ◽

pp. 116002 ◽

Cited By ~ 2

Author(s):

刘小梅 LIU Xiao-mei ◽

陈文浩 CHEN Wen-hao ◽

李妙 LI Miao ◽

周浪 ZHOU Lang

Keyword(s):

Silicon Wafers ◽

Diamond Wire ◽

Etching Method

Vapor Etching Method for Diamond Wire Sawn Multicrystalline Silicon Wafers

ACTA PHOTONICA SINICA ◽

10.3788/gzxb20144311.1116006 ◽

2014 ◽

Vol 43 (11) ◽

pp. 1116006

Author(s):

刘小梅 LIU Xiao-mei ◽

陈文浩 CHEN Wen-hao ◽

李妙 LI Miao ◽

周浪 ZHOU Lang

Keyword(s):

Silicon Wafers ◽

Diamond Wire ◽

Etching Method

How Gettering Affects the Temperature Sensitivity of the Implied Open Circuit Voltage of Multicrystalline Silicon Wafers

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) ◽

10.1109/pvsc40753.2019.8980880 ◽

2019 ◽

Cited By ~ 2

Author(s):

Sissel Tind Kristensen ◽

Shuai Nie ◽

Charly Berthod ◽

Rune Strandberg ◽

Jan Ove Odden ◽

...

Keyword(s):

Temperature Sensitivity ◽

Open Circuit Voltage ◽

Open Circuit ◽

Silicon Wafers ◽

A new method for rapid measurement of orientations and sizes of grains in multicrystalline silicon wafers

2011 37th IEEE Photovoltaic Specialists Conference ◽

10.1109/pvsc.2011.6186278 ◽

2011 ◽

Cited By ~ 4

Author(s):

Bhushan Sopori ◽

Debraj Guhabiswas ◽

Przemyslaw Rupnowski ◽

Sudhakar Shet ◽

Srinivas Devayajanam ◽

...

Keyword(s):

Silicon Wafers ◽

New Method ◽

Rapid Measurement

Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 ◽

Combined characterization of inhomogeneities in DCM multicrystalline silicon wafers [solar cells]

10.1109/pvsc.1996.564039 ◽

1996 ◽

Author(s):

A. Fukatsu ◽

T. Saitoh ◽

I. Hide

Keyword(s):

Solar Cells ◽

Silicon Wafers ◽

Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopy

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 ◽

10.1109/pvsc-vol2.2013.6656761 ◽

2013 ◽

Author(s):

Lei Meng ◽

Satyavolu S. Papa Rao ◽

Charanjit S. Bhatia ◽

Steven E. Steen ◽

Alan G. Street ◽

...

Keyword(s):

Silicon Wafers ◽

Acoustic Microscopy ◽

Defect Characterization ◽

Electron Acoustic ◽

Scanning Electron

Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis

Journal of Analytical Atomic Spectrometry ◽

10.1039/c2ja30188a ◽

2012 ◽

Vol 27 (11) ◽

pp. 1875 ◽

Cited By ~ 5

Author(s):

Günter Buzanich ◽

Martin Radtke ◽

Uwe Reinholz ◽

Heinrich Riesemeier ◽

Andreas F. Thünemann ◽

...

Keyword(s):

Solar Cells ◽

Fluorescence Analysis ◽

Silicon Wafers ◽

X Ray