INFRARED LBIC SCAN MAPS APPLIED TO ALUMINIUM GETTERED MULTICRYSTALLINE SILICON WAFERS
1991 ◽
Vol 01
(C6)
◽
pp. C6-237-C6-238
◽
J. Y. NATOLI
◽
M. PASQUINELLI
◽
F. FLORET
◽
S. MARTINUZZI
2013 ◽
Vol 23
(1)
◽
pp. 30-36
◽
Yacine Boulfrad
◽
Antti Haarahiltunen
◽
Hele Savin
◽
Eivind J. Øvrelid
◽
Lars Arnberg
Aditya Kovvali
◽
Matthias Demant
◽
Theresa Trötschler
◽
Jonas Haunschild
◽
Stefan Rein
2003 ◽
Vol 76
(2)
◽
pp. 155-166
◽
W.A. Nositschka
◽
C. Beneking
◽
O. Voigt
◽
H. Kurz
2015 ◽
Vol 44
(1)
◽
pp. 116002
◽
刘小梅 LIU Xiao-mei
◽
陈文浩 CHEN Wen-hao
◽
李妙 LI Miao
◽
周浪 ZHOU Lang
2014 ◽
Vol 43
(11)
◽
pp. 1116006
刘小梅 LIU Xiao-mei
◽
陈文浩 CHEN Wen-hao
◽
李妙 LI Miao
◽
周浪 ZHOU Lang
Sissel Tind Kristensen
◽
Shuai Nie
◽
Charly Berthod
◽
Rune Strandberg
◽
Jan Ove Odden
◽
...
Bhushan Sopori
◽
Debraj Guhabiswas
◽
Przemyslaw Rupnowski
◽
Sudhakar Shet
◽
Srinivas Devayajanam
◽
...
A. Fukatsu
◽
T. Saitoh
◽
I. Hide
Lei Meng
◽
Satyavolu S. Papa Rao
◽
Charanjit S. Bhatia
◽
Steven E. Steen
◽
Alan G. Street
◽
...
2012 ◽
Vol 27
(11)
◽
pp. 1875
◽
Günter Buzanich
◽
Martin Radtke
◽
Uwe Reinholz
◽
Heinrich Riesemeier
◽
Andreas F. Thünemann
◽
...