Determination of Carrier Diffusion Length Using Transient Electron Photoemission Microscopy in the GaAs/InSe Heterojunction

Imaging transport for the determination of minority carrier diffusion length

Applied Physics Letters ◽

10.1063/1.2196236 ◽

2006 ◽

Vol 88 (16) ◽

pp. 163509 ◽

Cited By ~ 25

Author(s):

D. R. Luber ◽

F. M. Bradley ◽

N. M. Haegel ◽

M. C. Talmadge ◽

M. P. Coleman ◽

...

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Determination of the minority carrier diffusion length in compositionally graded Cu(In,Ga)Se2 solar cells using electron beam induced current

Applied Physics Letters ◽

10.1063/1.3291046 ◽

2010 ◽

Vol 96 (2) ◽

pp. 022104 ◽

Cited By ~ 49

Author(s):

Gregory Brown ◽

Vladimir Faifer ◽

Alex Pudov ◽

Sergey Anikeev ◽

Eugene Bykov ◽

...

Keyword(s):

Electron Beam ◽

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Induced Current ◽

Carrier Diffusion ◽

Electron Beam Induced Current

Determination of minority carrier diffusion length of sprayed-Cu 2 ZnSnS 4 thin films

Solid-State Electronics ◽

10.1016/j.sse.2015.12.003 ◽

2016 ◽

Vol 118 ◽

pp. 1-3 ◽

Cited By ~ 20

Author(s):

Maykel Courel ◽

E. Valencia-Resendiz ◽

F.A. Pulgarín-Agudelo ◽

O. Vigil-Galán

Keyword(s):

Thin Films ◽

Minority Carrier ◽

Diffusion Length ◽

Simple method for the determination of the minority carrier diffusion length in metal/insulator/semiconductor solar cells

Solar Cells ◽

10.1016/0379-6787(83)90051-0 ◽

1983 ◽

Vol 9 (3) ◽

pp. 257-260 ◽

Cited By ~ 2

Author(s):

S. Niedźwiedź ◽

S.K. Krawczyk

Keyword(s):

Solar Cells ◽

Minority Carrier ◽

Diffusion Length ◽

Simple Method ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Determination of Minority Carrier Diffusion Length in Silicon Wafers by a Dual Electrolyte Cell

The Journal of Physical Chemistry B ◽

10.1021/jp9639206 ◽

1997 ◽

Vol 101 (20) ◽

pp. 3961-3967 ◽

Cited By ~ 2

Author(s):

Sandro Cattarin ◽

Laurence M. Peter

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Silicon Wafers ◽

Determination of carrier diffusion length in GaN

Journal of Applied Physics ◽

10.1063/1.4905506 ◽

2015 ◽

Vol 117 (1) ◽

pp. 013106 ◽

Cited By ~ 19

Author(s):

Shopan Hafiz ◽

Fan Zhang ◽

Morteza Monavarian ◽

Vitaliy Avrutin ◽

Hadis Morkoç ◽

...

Keyword(s):

Diffusion Length ◽

A corrosion study and minority carrier diffusion length determination of n-type SnS2 and SnSSe

Electrochimica Acta ◽

10.1016/0013-4686(86)85010-1 ◽

1986 ◽

Vol 31 (7) ◽

pp. 795-800 ◽

Cited By ~ 7

Author(s):

B. Fotouhi ◽

A. Katty

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Carrier Diffusion ◽

Corrosion Study ◽

Length Determination

Use of a laser beam interference technique for the determination of the minority carrier diffusion length in layers of a p‐n junction

Applied Physics Letters ◽

10.1063/1.113322 ◽

1995 ◽

Vol 66 (14) ◽

pp. 1788-1790 ◽

Cited By ~ 1

Author(s):

D. Levy ◽

K. Weiser

Keyword(s):

Laser Beam ◽

Minority Carrier ◽

Diffusion Length ◽

Determination of the minority carrier diffusion length of SnS using electro-optical measurements

Electronic Materials Letters ◽

10.1007/s13391-013-2194-3 ◽

2013 ◽

Vol 9 (3) ◽

pp. 363-366 ◽

Cited By ~ 10

Author(s):

K. T. Ramakrishna Reddy ◽

P. A. Nwofe ◽

R. W. Miles

Keyword(s):

Minority Carrier ◽

Diffusion Length ◽

Optical Measurements ◽

Determination of minority‐carrier diffusion length by integral properties of electron‐beam‐induced current profiles

Journal of Applied Physics ◽

10.1063/1.349454 ◽

1991 ◽

Vol 70 (4) ◽

pp. 2163-2168 ◽

Cited By ~ 12

Author(s):

D. Cavalcoli ◽

A. Cavallini ◽

A. Castaldini

Keyword(s):

Electron Beam ◽

Minority Carrier ◽

Diffusion Length ◽

Induced Current ◽

Carrier Diffusion ◽

Electron Beam Induced Current