The critical voltage effect in transmission electron microscopy. II. A theoretical study neglecting absorption effects

physica status solidi (b) ◽

10.1002/pssb.2220670126 ◽

1975 ◽

Vol 67 (1) ◽

pp. 273-286 ◽

Author(s):

R. Gevers ◽

R. Serneels ◽

M. David

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Theoretical Study ◽

Critical Voltage ◽

Transmission Electron

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Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study

Ultramicroscopy ◽

10.1016/j.ultramic.2011.03.005 ◽

2011 ◽

Vol 111 (8) ◽

pp. 1144-1154 ◽

Author(s):

S.D. Findlay ◽

N.R. Lugg ◽

N. Shibata ◽

L.J. Allen ◽

Y. Ikuhara

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Theoretical Study ◽

Bright Field ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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The critical voltage effect in transmission electron microscopy. V. The case of non-centrosymmetric crystals

physica status solidi (b) ◽

10.1002/pssb.2220720113 ◽

1975 ◽

Vol 72 (1) ◽

pp. 123-133 ◽

Author(s):

R. Serneels ◽

M. David ◽

R. Gevers

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

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3I1430 Inverse Theoretical Study of Information Transfer in Transmission Electron Microscopy

Seibutsu Butsuri ◽

10.2142/biophys.42.s176_1 ◽

2002 ◽

Vol 42 (supplement2) ◽

pp. S176

Author(s):

S. Sugitani ◽

K. Nagayama

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Information Transfer ◽

Theoretical Study ◽

Transmission Electron

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The Critical Voltage Effect in Transmission Electron Microscopy. X. Experimental Observatisons in the Presence of Non-Systematic Reflections

physica status solidi (b) ◽

10.1002/pssb.2220870202 ◽

1978 ◽

Vol 87 (2) ◽

pp. 419-432 ◽

Author(s):

M. David ◽

G. van Tendeloo ◽

J. van Landuyt ◽

R. Gevers

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

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The critical voltage effect in transmission electron microscopy. VII. The Influence of Absorption

physica status solidi (b) ◽

10.1002/pssb.2220790122 ◽

1977 ◽

Vol 79 (1) ◽

pp. 215-230 ◽

Author(s):

M. David ◽

R. Gevers ◽

R. Serneels

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

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The Critical Voltage Effect in Transmission Electron Microscopy. VIII. The Qualitative Influence of Non-Systematic Reflections on the Critical Voltage

physica status solidi (b) ◽

10.1002/pssb.2220800209 ◽

1977 ◽

Vol 80 (2) ◽

pp. 477-490 ◽

Author(s):

M. David ◽

R. Gevers

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

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The Critical Voltage Effect in Transmission Electron Microscopy. I. Eigenvalue Degeneracy in the Three-Beam Case

physica status solidi (b) ◽

10.1002/pssb.2220660209 ◽

1974 ◽

Vol 66 (2) ◽

pp. 471-482 ◽

Author(s):

R. Gevers ◽

R. Serneels ◽

M. David

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

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The Critical Voltage Effect in Transmission Electron Microscopy: VI. Renormalized Perturbation Theory for the Treatment of Absorption

physica status solidi (b) ◽

10.1002/pssb.2220740139 ◽

1976 ◽

Vol 74 (1) ◽

pp. 359-373 ◽

Author(s):

M. David ◽

R. Gevers ◽

R. Serneels

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Perturbation Theory ◽

Critical Voltage ◽

Transmission Electron

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The critical voltage effect in transmission electron microscopy. III. Influence of weak beams on degeneracy

physica status solidi (b) ◽

10.1002/pssb.2220690229 ◽

1975 ◽

Vol 69 (2) ◽

pp. 557-567 ◽

Author(s):

R. Gevers ◽

M. David ◽

R. Serneels

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

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The critical voltage effect in transmission electron microscopy. IX. The Calculation of Critical Voltages and Experimental Extinction Distances in Complicated Many-Beam Systems

physica status solidi (b) ◽

10.1002/pssb.2220840115 ◽

1977 ◽

Vol 84 (1) ◽

pp. 133-147 ◽

Author(s):

M. David ◽

R. Gevers

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Critical Voltage ◽

Transmission Electron

Download Full-text