Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films

2010 ◽  
pp. NA-NA ◽  
Author(s):  
Aliaksei Vetushka ◽  
Antonin Fejfar ◽  
Martin Ledinský ◽  
Bohuslav Rezek ◽  
Jiří Stuchlík ◽  
...  
2011 ◽  
Vol 5 (10-11) ◽  
pp. 373-375 ◽  
Author(s):  
Martin Ledinský ◽  
Antonín Fejfar ◽  
Aliaksei Vetushka ◽  
Jiří Stuchlík ◽  
Bohuslav Rezek ◽  
...  

2010 ◽  
Vol 518 (12) ◽  
pp. 3267-3272 ◽  
Author(s):  
Krzysztof Kolanek ◽  
Peter Hermann ◽  
Piotr T. Dudek ◽  
Teodor Gotszalk ◽  
Dmytro Chumakov ◽  
...  

2011 ◽  
Vol 1321 ◽  
Author(s):  
Antonín Fejfar ◽  
Petr Klapetek ◽  
Jakub Zlámal ◽  
Aliaksei Vetushka ◽  
Martin Ledinský ◽  
...  

ABSTRACTMicroscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous matrix. C-AFM experiments were interpreted using simulations of electric field and current distributions. Density of absorbed optical power was calculated by numerically solving the Maxwell equations. The goal of this study is to combine both models in order to simulate local photoconductivity for understanding the charge photogeneration and collection in nanostructured solar cells.


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