A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis

G. F. Bastin; H. J. M. Heijligers; F. J. J. van Loo

doi:10.1002/sca.4950080204

A Further Improvement in the Gaussian ϕ(ϱ) Approach for Matrix Correction in Quantitative Electron Probe Microanalysis

Scanning ◽

10.1002/sca.4950080204 ◽

1986 ◽

Vol 8 (2) ◽

pp. 45-67 ◽

Cited By ~ 87

Author(s):

G. F. Bastin ◽

H. J. M. Heijligers ◽

F. J. J. van Loo

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Matrix Correction ◽

Quantitative Electron Probe Microanalysis

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QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF CARBON IN CARBIDES USING A GAUSSIAN ϕ( ρz) EQUATION

Le Journal de Physique Colloques ◽

10.1051/jphyscol:19842142 ◽

1984 ◽

Vol 45 (C2) ◽

pp. C2-609-C2-612

Author(s):

J. D. Brown ◽

P. Schwaab ◽

A. P. von Rosenstiel

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis

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HISTORY OF QUANTITATIVE ELECTRON PROBE MICROANALYSIS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984201 ◽

1984 ◽

Vol 45 (C2) ◽

pp. C2-3-C2-8

Author(s):

K. F.J. Heinrich

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis ◽

History Of

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Application of Monte Carlo Calculations to Improve Quantitative Electron Probe Microanalysis

Microscopy and Microanalysis ◽

10.1017/s1431927614005261 ◽

2014 ◽

Vol 20 (S3) ◽

pp. 708-709 ◽

Cited By ~ 1

Author(s):

Xavier Llovet ◽

Philippe T. Pinard ◽

Francesc Salvat

Keyword(s):

Monte Carlo ◽

Electron Probe Microanalysis ◽

Electron Probe ◽

Monte Carlo Calculations ◽

Quantitative Electron Probe Microanalysis

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Quantitative electron-probe microanalysis

Microchemical Journal ◽

10.1016/0026-265x(86)90132-3 ◽

1986 ◽

Vol 34 (3) ◽

pp. 357-358

Author(s):

George W.C. Hung

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis

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Quantitative electron probe microanalysis in the system Fe-Sn-C using the Claisse-Quintin relation

X-Ray Spectrometry ◽

10.1002/xrs.1300140109 ◽

1985 ◽

Vol 14 (1) ◽

pp. 36-42 ◽

Cited By ~ 3

Author(s):

W. Fredriksz ◽

H. Koster ◽

B. H. Kolster

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis

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Quantitative Electron Probe Microanalysis of Thin Films

Journal of the Japan Institute of Metals and Materials ◽

10.2320/jinstmet1952.37.7_673 ◽

1973 ◽

Vol 37 (7) ◽

pp. 673-677 ◽

Cited By ~ 3

Author(s):

Yuzo Oda ◽

Koichi Nakajima

Keyword(s):

Thin Films ◽

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis

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Propagation of Errors in Correction Models for Quantitative Electron Probe Microanalysis

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_22 ◽

1969 ◽

pp. 151-159

Author(s):

K. F. J. Heinrich ◽

H. Yakowitz

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis ◽

Propagation Of Errors

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Quantitative electron probe microanalysis of Y-Ba-Cu-O superconducting materials

Microchimica Acta ◽

10.1007/bf01244169 ◽

1990 ◽

Vol 101 (1-6) ◽

pp. 161-172 ◽

Cited By ~ 2

Author(s):

Peter Karduck ◽

Živko Štrbački ◽

Dorothee Bonnenberg

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Superconducting Materials ◽

Quantitative Electron Probe Microanalysis

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V. D. Scott, G Love and S. J. B. Reed. Quantitative Electron-Probe Microanalysis (second edition). London and New York (Ellis Horwood) 1995. xiv + 311 pp., Price £31.50 (paperback) ISBN 0 13 104050 2.

Mineralogical Magazine ◽

10.1180/minmag.1995.059.397.27 ◽

1995 ◽

Vol 59 (397) ◽

pp. 774-774

Author(s):

P. J. Potts

Keyword(s):

New York ◽

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis

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Quantitative Electron Probe Microanalysis of Oxygen

Japanese Journal of Applied Physics ◽

10.1143/jjap.10.963b ◽

1971 ◽

Vol 10 (7) ◽

pp. 963B-963B

Author(s):

Toshio Shiraiwa ◽

Nobukatsu Fujino

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe ◽

Quantitative Electron Probe Microanalysis

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