Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

The Correlation between Microradiography and Scanning Electron Microscopy of Bone Section Surfaces

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_101 ◽

1969 ◽

pp. 611-612 ◽

Cited By ~ 1

Author(s):

M. H. Hobdell ◽

A. Boyde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Bone Section ◽

Scanning Electron

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Electron Microprobe Studies on the Mineralization Process of Tooth and Bone

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_97 ◽

1969 ◽

pp. 592-596

Author(s):

S. Suga

Keyword(s):

Electron Microprobe ◽

Mineralization Process

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Comparison between X-Ray Fluorescence and Ultra-Micro Flame Photometric Analyses of the Electrolyte Content in Single Cells

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_93 ◽

1969 ◽

pp. 561-568 ◽

Cited By ~ 1

Author(s):

H. Haljamäe ◽

H. Röckert

Keyword(s):

Single Cells ◽

X Ray ◽

Electrolyte Content

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Electron Probe Microanalysis of Ti(C, N) and Zr(C, N) in Steel

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_87 ◽

1969 ◽

pp. 531-534

Author(s):

T. Shiratwa ◽

N. Fujino

Keyword(s):

Electron Probe Microanalysis ◽

Electron Probe

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Analyse des précipités extraits sur repliques, à l’aide d’un microanalyseur classique et d’un microanalyseur équipé d’un microscope électronique

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_85 ◽

1969 ◽

pp. 509-518 ◽

Cited By ~ 1

Author(s):

M. Ancey ◽

G. Henry ◽

J. Philibert ◽

R. Tixier

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Untersuchungen an supraleitenden Diffusionsschichten mit einer Elektronenstrahlmikrosonde

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_80 ◽

1969 ◽

pp. 481-484

Author(s):

G. Otto ◽

H. Wizgall

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Trace Elements in Ferro-Alloy Deoxidants and Their Influence on Non-Metallic Inclusion Compositions

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_79 ◽

1969 ◽

pp. 474-480

Author(s):

G. Franklin ◽

G. Rule ◽

R. Widdowson

Keyword(s):

Trace Elements ◽

Metallic Inclusion

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An Electron Microprobe Analysis of Cu2−x Layers Chemiplated on Single Crystals and Thin Films of CdS

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_75 ◽

1969 ◽

pp. 447-457 ◽

Cited By ~ 1

Author(s):

M. Fabbricotti ◽

A. v. Aerschodt ◽

J. J. Loferski ◽

K. K. Reinhartz ◽

A. P. v. Rosenstiel ◽

...

Keyword(s):

Thin Films ◽

Single Crystals ◽

Electron Microprobe ◽

Microprobe Analysis ◽

Electron Microprobe Analysis

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Specimen Damage during Microprobe Analysis of Silicate Glasses

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_73 ◽

1969 ◽

pp. 438-442

Author(s):

S. Scholes ◽

F. C. F. Wilkinson

Keyword(s):

Microprobe Analysis ◽

Silicate Glasses

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Nouvelle méthode d’obtention des diagrammes de diffraction en rayonnement X divergent

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse ◽

10.1007/978-3-662-12108-5_69 ◽

1969 ◽

pp. 412-414

Author(s):

J. Despujols ◽

F. Jordi

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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

The Correlation between Microradiography and Scanning Electron Microscopy of Bone Section Surfaces

Electron Microprobe Studies on the Mineralization Process of Tooth and Bone

Comparison between X-Ray Fluorescence and Ultra-Micro Flame Photometric Analyses of the Electrolyte Content in Single Cells

Electron Probe Microanalysis of Ti(C, N) and Zr(C, N) in Steel

Analyse des précipités extraits sur repliques, à l’aide d’un microanalyseur classique et d’un microanalyseur équipé d’un microscope électronique

Untersuchungen an supraleitenden Diffusionsschichten mit einer Elektronenstrahlmikrosonde

Trace Elements in Ferro-Alloy Deoxidants and Their Influence on Non-Metallic Inclusion Compositions

An Electron Microprobe Analysis of Cu2−x Layers Chemiplated on Single Crystals and Thin Films of CdS

Specimen Damage during Microprobe Analysis of Silicate Glasses

Nouvelle méthode d’obtention des diagrammes de diffraction en rayonnement X divergent

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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la MicroanalyseLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

The Correlation between Microradiography and Scanning Electron Microscopy of Bone Section Surfaces

Electron Microprobe Studies on the Mineralization Process of Tooth and Bone

Comparison between X-Ray Fluorescence and Ultra-Micro Flame Photometric Analyses of the Electrolyte Content in Single Cells

Electron Probe Microanalysis of Ti(C, N) and Zr(C, N) in Steel

Analyse des précipités extraits sur repliques, à l’aide d’un microanalyseur classique et d’un microanalyseur équipé d’un microscope électronique

Untersuchungen an supraleitenden Diffusionsschichten mit einer Elektronenstrahlmikrosonde

Trace Elements in Ferro-Alloy Deoxidants and Their Influence on Non-Metallic Inclusion Compositions

An Electron Microprobe Analysis of Cu2−x Layers Chemiplated on Single Crystals and Thin Films of CdS

Specimen Damage during Microprobe Analysis of Silicate Glasses

Nouvelle méthode d’obtention des diagrammes de diffraction en rayonnement X divergent

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Latest Publications