scholarly journals Multimodal Characterization of Resin Embedded and Sliced Polymer Nanoparticles by Means of Tip‐Enhanced Raman Spectroscopy and Force–Distance Curve Based Atomic Force Microscopy

Small ◽  
2020 ◽  
Vol 16 (17) ◽  
pp. 1907418
Author(s):  
Christiane Höppener ◽  
Felix H. Schacher ◽  
Volker Deckert
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Polymer Nanoparticles ◽  
Distance Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Label-free identification and characterization of living human primary and secondary tumour cells

The Analyst ◽  
2015 ◽  
Vol 140 (15) ◽  
pp. 5162-5168 ◽  
Author(s):  
Dimitrios Tsikritsis ◽  
Susanna Richmond ◽  
Patrick Stewart ◽  
Alistair Elfick ◽  
Andrew Downes
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Tumour Cells ◽  
Label Free ◽  
Force Microscopy ◽  
Atomic Force ◽  
Secondary Tumour ◽  
Identification And Characterization

Primary and secondary tumour cells exhibit biochemical differences (with Raman spectroscopy and imaging), and mechanical differences (with atomic force microscopy).

Atomic Force Microscopy Based Top-Illumination Electrochemical Tip-Enhanced Raman Spectroscopy

2020 ◽  
Vol 92 (18) ◽  
pp. 12548-12555 ◽  
Author(s):  
Yi-Fan Bao ◽  
Mao-Feng Cao ◽  
Si-Si Wu ◽  
Teng-Xiang Huang ◽  
Zhi-Cong Zeng ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Atomic Force Microscopy with Raman and Tip-Enhanced Raman Spectroscopy

2012 ◽  
Vol 20 (6) ◽  
pp. 22-27 ◽  
Author(s):  
Stefan B. Kaemmer ◽  
Ton Ruiter ◽  
Bede Pittenger
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Complementary Information ◽  
Combined System ◽  
Force Microscopy ◽  
Additional Information ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy

Both atomic force microscopy (AFM) and Raman spectroscopy are techniques used to gather information about the surface properties of a sample. There are many reasons to combine these two technologies, and this article looks both at the complementary information gained from the techniques and how a researcher having access to a combined system can benefit from the additional information available.

scholarly journals Atomic Force Microscopy Based Tip-Enhanced Raman Spectroscopy in Biology

2018 ◽  
Vol 19 (4) ◽  
pp. 1193 ◽  
Author(s):  
Lizhen Gao ◽  
Huiling Zhao ◽  
Tianfeng Li ◽  
Peipei Huo ◽  
Dong Chen ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Enhanced Raman Spectroscopy
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