Atomic Force Microscopy with Raman and Tip-Enhanced Raman Spectroscopy
Keyword(s):
Both atomic force microscopy (AFM) and Raman spectroscopy are techniques used to gather information about the surface properties of a sample. There are many reasons to combine these two technologies, and this article looks both at the complementary information gained from the techniques and how a researcher having access to a combined system can benefit from the additional information available.
2020 ◽
Vol 92
(18)
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pp. 12548-12555
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2018 ◽
Vol 19
(4)
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pp. 1193
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2012 ◽
Vol 83
(12)
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pp. 123708
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