Locally Determining the Number of Neighbors in the k-Nearest Neighbor Rule Based on Statistical Confidence

Lecture Notes in Computer Science - Advances in Natural Computation ◽

10.1007/11539087_9 ◽

2005 ◽

pp. 71-80

Author(s):

Jigang Wang ◽

Predrag Neskovic ◽

Leon N. Cooper

Keyword(s):

Nearest Neighbor ◽

K Nearest Neighbor ◽

Statistical Confidence ◽

Nearest Neighbor Rule

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The condensed fuzzy k-nearest neighbor rule based on sample fuzzy entropy

2011 International Conference on Machine Learning and Cybernetics ◽

10.1109/icmlc.2011.6016738 ◽

2011 ◽

Author(s):

Jun-Hai Zhai ◽

Na Li ◽

Meng-Yao Zhai

Keyword(s):

Nearest Neighbor ◽

Fuzzy Entropy ◽

K Nearest Neighbor ◽

Nearest Neighbor Rule

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Neighborhood size selection in the k-nearest-neighbor rule using statistical confidence

Pattern Recognition ◽

10.1016/j.patcog.2005.08.009 ◽

2006 ◽

Vol 39 (3) ◽

pp. 417-423 ◽

Author(s):

Jigang Wang ◽

Predrag Neskovic ◽

Leon N. Cooper

Keyword(s):

Nearest Neighbor ◽

Neighborhood Size ◽

K Nearest Neighbor ◽

Size Selection ◽

Statistical Confidence ◽

Nearest Neighbor Rule

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A new evidential K-nearest neighbor rule based on contextual discounting with partially supervised learning

International Journal of Approximate Reasoning ◽

10.1016/j.ijar.2019.07.009 ◽

2019 ◽

Vol 113 ◽

pp. 287-302 ◽

Author(s):

Thierry Denœux ◽

Orakanya Kanjanatarakul ◽

Songsak Sriboonchitta

Keyword(s):

Supervised Learning ◽

Nearest Neighbor ◽

K Nearest Neighbor ◽

Partially Supervised Learning ◽

Nearest Neighbor Rule

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Fault Detection Using the k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2007.907607 ◽

2007 ◽

Vol 20 (4) ◽

pp. 345-354 ◽

Author(s):

Q. Peter He ◽

Jin Wang

Keyword(s):

Fault Detection ◽

Semiconductor Manufacturing ◽

Nearest Neighbor ◽

Manufacturing Processes ◽

K Nearest Neighbor ◽

Nearest Neighbor Rule

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Automated feature learning for nonlinear process monitoring – An approach using stacked denoising autoencoder and k-nearest neighbor rule

Journal of Process Control ◽

10.1016/j.jprocont.2018.02.004 ◽

2018 ◽

Vol 64 ◽

pp. 49-61 ◽

Author(s):

Zehan Zhang ◽

Teng Jiang ◽

Shuanghong Li ◽

Yupu Yang

Keyword(s):

Process Monitoring ◽

Nearest Neighbor ◽

Feature Learning ◽

Nonlinear Process ◽

K Nearest Neighbor ◽

Denoising Autoencoder ◽

Nonlinear Process Monitoring ◽

Nearest Neighbor Rule

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Automated Fault Detection Using Convolutional Auto Encoder and k Nearest Neighbor Rule for Semiconductor Manufacturing Processes

2020 3rd International Conference on Intelligent Autonomous Systems (ICoIAS) ◽

10.1109/icoias49312.2020.9081852 ◽

2020 ◽

Author(s):

Haili Zhang ◽

Pu Wang ◽

Xuejin Gao ◽

Huihui Gao ◽

Yongsheng Qi

Keyword(s):

Fault Detection ◽

Semiconductor Manufacturing ◽

Nearest Neighbor ◽

Manufacturing Processes ◽

K Nearest Neighbor ◽

Nearest Neighbor Rule

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Fault Isolation Based On k-Nearest Neighbor Rule For Industrial Processes

IEEE Transactions on Industrial Electronics ◽

10.1109/tie.2016.2520898 ◽

2016 ◽

pp. 1-1 ◽

Author(s):

Zhe Zhou ◽

Chenglin Wen ◽

Chunjie Yang

Keyword(s):

Nearest Neighbor ◽

Fault Isolation ◽

Industrial Processes ◽

K Nearest Neighbor ◽

Nearest Neighbor Rule

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A new edited k-nearest neighbor rule in the pattern classification problem

Pattern Recognition ◽

10.1016/s0031-3203(99)00068-0 ◽

2000 ◽

Vol 33 (3) ◽

pp. 521-528 ◽

Author(s):

Kazuo Hattori ◽

Masahito Takahashi

Keyword(s):

Pattern Classification ◽

Nearest Neighbor ◽

Classification Problem ◽

K Nearest Neighbor ◽

Nearest Neighbor Rule

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A dynamic ensemble outlier detection model based on an adaptive k-nearest neighbor rule

Information Fusion ◽

10.1016/j.inffus.2020.05.001 ◽

2020 ◽

Vol 63 ◽

pp. 30-40

Author(s):

Biao Wang ◽

Zhizhong Mao

Keyword(s):

Outlier Detection ◽

Nearest Neighbor ◽

K Nearest Neighbor ◽

Detection Model ◽

Model Based ◽

Nearest Neighbor Rule

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Random projection based k Nearest Neighbor rule for semiconductor process fault detection

Proceedings of the 33rd Chinese Control Conference ◽

10.1109/chicc.2014.6895459 ◽

2014 ◽

Author(s):

Zhe Zhou ◽

Chunjie Yang ◽

Chenglin Wen

Keyword(s):

Fault Detection ◽

Nearest Neighbor ◽

Random Projection ◽

K Nearest Neighbor ◽

Nearest Neighbor Rule ◽

Semiconductor Process

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