The leakage current, active power and delay characterizations of the domino circuits in the presence of P-V-T (Process, Voltage, and Temperature) variations are analyzed based on multiple-parameter Monte Carlo method. It is demonstrated that failing to account for P-V-T variations and process-electro-thermal couplings can result in significant inaccuracy in transistor-level performance estimation. It also indicates that under significant P-V-T variations, DTV (Dual VtTechnology) is still highly effective to reduce the leakage current and active power for domino circuits, but induces speed penalty. At last, the robustness of different domino circuits with DTV against the P-V-T variations is discussed.
A Hybrid Framework for Fast and Accurate GPU Performance Estimation through Source-Level Analysis and Trace-Based Simulation
