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Redundancy Identification
Efficient Branch and Bound Search with Application to Computer-Aided Design - Frontiers in Electronic Testing
◽
10.1007/978-1-4613-1329-8_8
◽
1996
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pp. 97-101
Author(s):
Xinghao Chen
◽
Michael L. Bushnell
Keyword(s):
Redundancy Identification
Download Full-text
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References
Multi-node static logic implications for redundancy identification
Proceedings of the conference on Design, automation and test in Europe - DATE '00
◽
10.1145/343647.344102
◽
2000
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Cited By ~ 2
Author(s):
Kabir Gulrajani
◽
Michael S. Hsiao
Keyword(s):
Redundancy Identification
◽
Static Logic
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Kinematics Redundancy Identification of Arbitrary Serial Robot
10.1109/icma52036.2021.9512730
◽
2021
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Author(s):
Lingxiao Li
◽
Lu Li
◽
Yanan Wang
◽
Baolin Feng
◽
Guojiang Li
Keyword(s):
Serial Robot
◽
Redundancy Identification
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A new transitive closure algorithm with application to redundancy identification
Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002
◽
10.1109/delta.2002.994683
◽
2003
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Cited By ~ 3
Author(s):
V. Gaur
◽
V.D. Agrawal
◽
M.L. Bushnell
Keyword(s):
Transitive Closure
◽
Redundancy Identification
◽
Closure Algorithm
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SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION
1991, Proceedings. International Test Conference
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10.1109/test.1991.519509
◽
2005
◽
Cited By ~ 21
Author(s):
J. Giraldi
◽
M.L. Bushnell
Keyword(s):
Test Generation
◽
Redundancy Identification
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RDIBP: Redundancy identification on boolean functions with paths
2011 IEEE International Conference on Computer Science and Automation Engineering
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10.1109/csae.2011.5953261
◽
2011
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Author(s):
Yue Huang
◽
Zhilei Chai
◽
Wenbo Xu
Keyword(s):
Boolean Functions
◽
Redundancy Identification
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Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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10.1109/43.238030
◽
1993
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Vol 12
(7)
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pp. 935-945
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Cited By ~ 83
Author(s):
H. Cho
◽
G.D. Hachtel
◽
F. Somenzi
Keyword(s):
Test Generation
◽
Sequential Circuits
◽
State Enumeration
◽
Redundancy Identification
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Speculative reduction-based scalable redundancy identification
2009 Design, Automation & Test in Europe Conference & Exhibition
◽
10.1109/date.2009.5090932
◽
2009
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Cited By ~ 8
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◽
J. Baumgartner
◽
A. Mishchenko
◽
R. Brayton
Keyword(s):
Redundancy Identification
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Dynamic redundancy identification in automatic test generation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.124427
◽
1992
◽
Vol 11
(3)
◽
pp. 404-407
◽
Cited By ~ 17
Author(s):
M. Abramovici
◽
D.T. Miller
◽
R.K. Roy
Keyword(s):
Test Generation
◽
Automatic Test Generation
◽
Automatic Test
◽
Redundancy Identification
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Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests
IEICE Transactions on Information and Systems
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10.1587/transinf.2016fop0007
◽
2017
◽
Vol E100.D
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pp. 1182-1189
Author(s):
Hiroshi IWATA
◽
Nanami KATAYAMA
◽
Ken'ichi YAMAGUCHI
Keyword(s):
Formal Verification
◽
Transition Faults
◽
Redundancy Identification
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An efficient procedure for obtaining implication relations and its application to redundancy identification
Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259)
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10.1109/ats.1998.741586
◽
2002
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Author(s):
H. Ichiahra
◽
S. Kajihara
◽
K. Kinoshita
Keyword(s):
Efficient Procedure
◽
Redundancy Identification
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