Speculative reduction-based scalable redundancy identification

2009 Design, Automation & Test in Europe Conference & Exhibition ◽

10.1109/date.2009.5090932 ◽

2009 ◽

Author(s):

H. Mony ◽

J. Baumgartner ◽

A. Mishchenko ◽

R. Brayton

Keyword(s):

Redundancy Identification

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Multi-node static logic implications for redundancy identification

Proceedings of the conference on Design, automation and test in Europe - DATE '00 ◽

10.1145/343647.344102 ◽

2000 ◽

Author(s):

Kabir Gulrajani ◽

Michael S. Hsiao

Keyword(s):

Redundancy Identification ◽

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Kinematics Redundancy Identification of Arbitrary Serial Robot

10.1109/icma52036.2021.9512730 ◽

2021 ◽

Author(s):

Lingxiao Li ◽

Lu Li ◽

Yanan Wang ◽

Baolin Feng ◽

Guojiang Li

Keyword(s):

Serial Robot ◽

Redundancy Identification

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A new transitive closure algorithm with application to redundancy identification

Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002 ◽

10.1109/delta.2002.994683 ◽

2003 ◽

Author(s):

V. Gaur ◽

V.D. Agrawal ◽

M.L. Bushnell

Keyword(s):

Transitive Closure ◽

Redundancy Identification ◽

Closure Algorithm

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SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519509 ◽

2005 ◽

Author(s):

J. Giraldi ◽

M.L. Bushnell

Keyword(s):

Test Generation ◽

Redundancy Identification

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RDIBP: Redundancy identification on boolean functions with paths

2011 IEEE International Conference on Computer Science and Automation Engineering ◽

10.1109/csae.2011.5953261 ◽

2011 ◽

Author(s):

Yue Huang ◽

Zhilei Chai ◽

Wenbo Xu

Keyword(s):

Boolean Functions ◽

Redundancy Identification

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Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.238030 ◽

1993 ◽

Vol 12 (7) ◽

pp. 935-945 ◽

Author(s):

H. Cho ◽

G.D. Hachtel ◽

F. Somenzi

Keyword(s):

Test Generation ◽

Sequential Circuits ◽

State Enumeration ◽

Redundancy Identification

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Dynamic redundancy identification in automatic test generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.124427 ◽

1992 ◽

Vol 11 (3) ◽

pp. 404-407 ◽

Author(s):

M. Abramovici ◽

D.T. Miller ◽

R.K. Roy

Keyword(s):

Test Generation ◽

Automatic Test Generation ◽

Automatic Test ◽

Redundancy Identification

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Formal Verification-Based Redundancy Identification of Transition Faults with Broadside Scan Tests

IEICE Transactions on Information and Systems ◽

10.1587/transinf.2016fop0007 ◽

2017 ◽

Vol E100.D (6) ◽

pp. 1182-1189

Author(s):

Hiroshi IWATA ◽

Nanami KATAYAMA ◽

Ken'ichi YAMAGUCHI

Keyword(s):

Formal Verification ◽

Transition Faults ◽

Redundancy Identification

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Redundancy Identification

Efficient Branch and Bound Search with Application to Computer-Aided Design - Frontiers in Electronic Testing ◽

10.1007/978-1-4613-1329-8_8 ◽

1996 ◽

pp. 97-101

Author(s):

Xinghao Chen ◽

Michael L. Bushnell

Keyword(s):

Redundancy Identification

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An efficient procedure for obtaining implication relations and its application to redundancy identification

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741586 ◽

2002 ◽

Author(s):

H. Ichiahra ◽

S. Kajihara ◽

K. Kinoshita

Keyword(s):

Efficient Procedure ◽

Redundancy Identification

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