Present State of the Digital Laser Beam Deflection Technique for Alphanumeric and Graphic Displays

1975 ◽  
pp. 161-180
Author(s):  
U. J. Schmidt
Keyword(s):  
Laser Beam ◽  
Present State ◽  
Beam Deflection ◽  
Graphic Displays

Determination of gradient index based on laser beam deflection by stochastic particle swarm optimization

2021 ◽  
Vol 127 (9) ◽  
Author(s):  
Linyang Wei ◽  
Guojun Li ◽  
Miaomiao Song ◽  
Cun-Hai Wang ◽  
Weijun Zhang
Keyword(s):  
Particle Swarm Optimization ◽  
Laser Beam ◽  
Particle Swarm ◽  
Beam Deflection ◽  
Gradient Index ◽  
Swarm Optimization ◽  
Stochastic Particle

A Survey of Laser Beam Deflection Techniques

1974 ◽  
pp. 299-306
Author(s):  
V.J. FOWLER ◽  
J. SCHLAFER
Keyword(s):  
Laser Beam ◽  
Beam Deflection

Scanning Capacitance Microscopy of Dopants in III-V Semiconductors

1998 ◽  
Vol 4 (S2) ◽  
pp. 640-641
Author(s):  
David V. Lang
Keyword(s):  
Quantum Well ◽  
Laser Beam ◽  
Surface Topography ◽  
Cross Sections ◽  
Beam Deflection ◽  
Doping Analysis ◽  
Scanning Capacitance Microscopy ◽  
Sample Spacing ◽  
Doping Profiles ◽  
Multi Quantum Well

Scanning Capacitance Microscopy (SCM) was first developed in 1985 as a method for sensing tip-to-sample spacing for surface topography profiling in connection with the RCA VideoDisc. Williams and coworkers were the first to use an SCM for obtaining dC/dV doping profiles in semiconductors, albeit with a rather modest resolution of 200 nm. More recently, it has been developed as a 50-nmresolution tool for microscopic doping analysis of semiconductors by measuring the tip-to-sample rf capacitance in an AFM controlled by other means, e.g. by laser beam deflection of a cantilever tip. In this paper we report on the application of SCM to study the 2D doping profiles of InP-based devices, such as multi-quantum well lasers.It is particularly convenient to prepare cross sections of III-V devices, since the material readily cleaves on [110] planes, as compared to silicon where cross sections must be obtained by painstaking polishing.

scholarly journals Diffusion coefficient measurement system based on laser beam deflection on liquid: Image and data processing

2019 ◽  
Author(s):  
L. Soedarmawan ◽  
M. Aman ◽  
A. Hifzhi ◽  
S. Pambudi ◽  
A. Sudarmaji ◽  
...  
Keyword(s):  
Diffusion Coefficient ◽  
Laser Beam ◽  
Data Processing ◽  
Measurement System ◽  
Beam Deflection ◽  
Coefficient Measurement

Laser‐beam pulse shaping using spectral beam deflection

1993 ◽  
Vol 73 (6) ◽  
pp. 2678-2685 ◽  
Author(s):  
S. Skupsky ◽  
T. J. Kessler ◽  
S. A. Letzring ◽  
Y.‐H. Chuang
Keyword(s):  
Laser Beam ◽  
Pulse Shaping ◽  
Beam Deflection
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