Techniques for Estimating Test Length Under Random Test

Economics of Electronic Design, Manufacture and Test ◽

10.1007/978-1-4757-5048-5_15 ◽

1994 ◽

pp. 159-171

Author(s):

Amitava Majumdar ◽

Sarma B. K. Vrudhula

Keyword(s):

Test Length ◽

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Random test length for bounded faults in RAMs

Proceedings ETC 93 Third European Test Conference ◽

10.1109/etc.1993.246522 ◽

2002 ◽

Author(s):

R. David ◽

J.A. Brzozowski ◽

H. Jurgensen

Keyword(s):

Test Length ◽

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MICROPROCESSOR BOARDS: Compact Markov Models for Random Test Length Calculation

Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems - Informatik-Fachberichte ◽

10.1007/978-3-642-45628-2_9 ◽

1987 ◽

pp. 95-106 ◽

Author(s):

Z. Abazi ◽

P. Thevenod-Fosse

Keyword(s):

Markov Models ◽

Test Length ◽

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Probabilistic models for estimation of random and pseudo-random test length

Journal of Computer Science and Technology ◽

10.1007/bf02945770 ◽

1992 ◽

Vol 7 (2) ◽

pp. 164-174 ◽

Author(s):

Xiang Dong ◽

Wei Daozheng ◽

Chen Shisong

Keyword(s):

Probabilistic Models ◽

Test Length ◽

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On robustness of required random test length with regard to fault occurrence hypotheses

Proceedings of IEEE VLSI Test Symposium ◽

10.1109/vtest.1994.292290 ◽

2002 ◽

Author(s):

S. Crepaux ◽

M. Jacomino ◽

R. David

Keyword(s):

Test Length ◽

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Techniques for estimating test length under random test

Journal of Electronic Testing ◽

10.1007/bf00972088 ◽

1994 ◽

Vol 5 (2-3) ◽

pp. 285-297

Author(s):

Amitava Majumdar ◽

Sarma B. K. Vrudhula

Keyword(s):

Test Length ◽

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Random test length with and without replacement

Electronics Letters ◽

10.1049/el:19860736 ◽

1986 ◽

Vol 22 (20) ◽

pp. 1074 ◽

Author(s):

W.H. Debany ◽

P.K. Varshney ◽

C.R.P. Hartmann

Keyword(s):

Test Length ◽

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Methodology for an Operationally-Based Test Length Decision

10.21236/ada329144 ◽

1997 ◽

Author(s):

Donald P. Gaver ◽

Patricia A. Jacobs

Keyword(s):

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Efficient test length reduction techniques for interposer-based 2.5D ICs

Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test ◽

10.1109/vlsi-dat.2014.6834878 ◽

2014 ◽

Author(s):

Shyue-Kung Lu ◽

Huai-Min Li ◽

Masaki Hashizume ◽

Jin-Hua Hong ◽

Zheng-Ru Tsai

Keyword(s):

Test Length ◽

Reduction Techniques ◽

Efficient Test ◽

Length Reduction

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Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction

13th Asian Test Symposium ◽

10.1109/ats.2004.80 ◽

2005 ◽

Author(s):

Y. Higami ◽

S. Kajihara ◽

S.-y. Kobayashi ◽

Y. Takamatsu

Keyword(s):

Power Reduction ◽

Sequential Circuits ◽

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OPTIMAL TEST LENGTH FOR MAXIMUM BATTERY VALIDITY

ETS Research Bulletin Series ◽

10.1002/j.2333-8504.1950.tb00476.x ◽

1950 ◽

Vol 1950 (2) ◽

pp. i-18 ◽

Author(s):

Paul Horst

Keyword(s):

Test Length ◽

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