Transport Properties of Thin Metallic Films and Multilayers

Author(s):  
A. Fert
1987 ◽  
Vol 26 (S3-2) ◽  
pp. 1451 ◽  
Author(s):  
J. Slaughter ◽  
J. Bass ◽  
W. P. Pratt, Jr. ◽  
P. A. Schroeder ◽  
H. Sato

1961 ◽  
Vol 57 (3) ◽  
pp. 606-622 ◽  
Author(s):  
M. J. Baines

ABSTRACTIn using the Boltzmann equation to calculate the transport properties of thin metallic films, it is usually assumed that a time of relaxation exists for the scattering in the film which is the same as for the bulk metal, although this is only strictly justified in the ideal case of isotropic scattering. The correct Boltzmann equation in the case of elastic scattering, when the cross-section depends on the angle of scatter, is set up and possible methods of solution are discussed.The equation is solved for a simple anisotropic scattering law and the electrical resistivity and thermo-electric power are found to depend upon two parameters which are measures respectively of the thickness of the film and the anisotropy of the scattering mechanism. The numerical results for the electrical resistivity, however, differ only slightly from those given by the one-parameter formula obtained when a time of relaxation is assumed to exist.


1988 ◽  
Vol 38 (17) ◽  
pp. 12298-12309 ◽  
Author(s):  
Nandini Trivedi ◽  
N. W. Ashcroft

2007 ◽  
Vol 515 (17) ◽  
pp. 6921-6926 ◽  
Author(s):  
Dmitry V. Fedorov ◽  
Peter Zahn ◽  
Ingrid Mertig

1988 ◽  
Vol 102 ◽  
pp. 165-174
Author(s):  
C. de Michelis

AbstractImpurities being an important concern in tokamaks, spectroscopy plays a key role in their understanding. Techniques for the evaluation of concentrations, power losses and transport properties are surveyed, and a few developments are outlined.


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