SLS Integrated Modal Test Uncertainty Quantification Using the Hybrid Parametric Variation Method

This paper introduces the concepts of equipment test qualification and uncertainty quantification, and the analysis framework and process of equipment test uncertainty quantification. It analyzes the data uncertainty, model uncertainty and environmental uncertainty, and studies the corresponding uncertainty quantification theory to provide technical reference for the application of uncertainty quantification technology in the field of test identification.

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Uncertainty Quantification of Inducer Eigenvalues Using Conditional Assessment of Models and Modal Test of Simpler Systems

Model Validation and Uncertainty Quantification, Volume 3 - Conference Proceedings of the Society for Experimental Mechanics Series ◽

10.1007/978-3-030-77348-9_17 ◽

2022 ◽

pp. 127-138

Author(s):

Andrew M. Brown ◽

Jennifer L. DeLessio ◽

Timothy J. Wray

Keyword(s):

Uncertainty Quantification ◽

Modal Test

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Exit-surface wave reconstruction using a focal series

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129577 ◽

1992 ◽

Vol 50 (2) ◽

pp. 988-989

Author(s):

W.J. de Ruijter ◽

M.R. McCartney ◽

David J. Smith ◽

J.K. Weiss

Keyword(s):

Surface Wave ◽

Spherical Aberration ◽

Data Extraction ◽

High Sensitivity ◽

Geometric Distortion ◽

Variation Method ◽

Objective Lens ◽

Immediate Reconstruction ◽

Exit Surface ◽

Electron Microscopes

Further advances in resolution enhancement of transmission electron microscopes can be expected from digital processing of image data recorded with slow-scan CCD cameras. Image recording with these new cameras is essential because of their high sensitivity, extreme linearity and negligible geometric distortion. Furthermore, digital image acquisition allows for on-line processing which yields virtually immediate reconstruction results. At present, the most promising techniques for exit-surface wave reconstruction are electron holography and the recently proposed focal variation method. The latter method is based on image processing applied to a series of images recorded at equally spaced defocus.Exit-surface wave reconstruction using the focal variation method as proposed by Van Dyck and Op de Beeck proceeds in two stages. First, the complex image wave is retrieved by data extraction from a parabola situated in three-dimensional Fourier space. Then the objective lens spherical aberration, astigmatism and defocus are corrected by simply dividing the image wave by the wave aberration function calculated with the appropriate objective lens aberration coefficients which yields the exit-surface wave.

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