Characterization of Local Structures in Plasma Deposited Semiconductors by X-ray Absorption Spectroscopy

Author(s):  
M. Alper Sahiner
1995 ◽  
Vol 34 (3) ◽  
pp. 343-346 ◽  
Author(s):  
John M. Charnock ◽  
C. David Garner ◽  
Alfred X. Trautwein ◽  
Eckard Bill ◽  
Heiner Winkler ◽  
...  

Wear ◽  
1997 ◽  
Vol 202 (2) ◽  
pp. 172-191 ◽  
Author(s):  
Zhanfeng Yin ◽  
Masoud Kasrai ◽  
Marina Fuller ◽  
G.Michael Bancroft ◽  
Kim Fyfe ◽  
...  

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