Raman Spectroscopy-Enhanced IIT: In Situ Analysis of Mechanically Stressed Polycrystalline Si Thin Films
2018 ◽
Vol 126
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pp. 143-151
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2011 ◽
Vol 13
(5)
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pp. 418-422
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2019 ◽
Vol 91
(3)
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pp. 1675-1685
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1991 ◽
Vol 22
(10)
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pp. 573-575
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2005 ◽
Vol 383
(4)
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pp. 707-712
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