Iterative Learning Control for Spiral Scanning Patterns in Atomic Force Microscopy

2018 ◽  
pp. 389-399 ◽  
Author(s):  
Matheus S. de Oliveira ◽  
Aurélio T. Salton
Keyword(s):  
Atomic Force Microscopy ◽  
Iterative Learning Control ◽  
Learning Control ◽  
Iterative Learning ◽  
Force Microscopy ◽  
Spiral Scanning ◽  
Atomic Force

Intelligent tuning method of PID parameters based on iterative learning control for atomic force microscopy

Micron ◽  
2018 ◽  
Vol 104 ◽  
pp. 26-36 ◽  
Author(s):  
Hui Liu ◽  
Yingzi Li ◽  
Yingxu Zhang ◽  
Yifu Chen ◽  
Zihang Song ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Iterative Learning Control ◽  
Learning Control ◽  
Iterative Learning ◽  
Force Microscopy ◽  
Tuning Method ◽  
Atomic Force

scholarly journals Spiral Scanning and Encased Cantilevers for High Spatial and Temporal Resolution in Atomic Force Microscopy

2013 ◽  
Vol 104 (2) ◽  
pp. 512a
Author(s):  
Dominik Ziegler ◽  
Adrian Nievergelt ◽  
Arnaud Benard ◽  
Travis Meyer ◽  
Christoph Brune ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temporal Resolution ◽  
Force Microscopy ◽  
Spiral Scanning ◽  
Atomic Force
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