Traitor Tracing with Optimal Transmission Rate

Author(s):  
Nelly Fazio ◽  
Antonio Nicolosi ◽  
Duong Hieu Phan
Author(s):  
P. Hagemann

The use of computers in the analytical electron microscopy today shows three different trends (1) automated image analysis with dedicated computer systems, (2) instrument control by microprocessors and (3) data acquisition and processing e.g. X-ray or EEL Spectroscopy.While image analysis in the T.E.M. usually needs a television chain to get a sequential transmission suitable as computer input, the STEM system already has this necessary facility. For the EM400T-STEM system therefore an interface was developed, that allows external control of the beam deflection in TEM as well as the control of the STEM probe and video signal/beam brightness on the STEM screen.The interface sends and receives analogue signals so that the transmission rate is determined by the convertors in the actual computer periphery.


2014 ◽  
Vol E97.B (10) ◽  
pp. 2118-2126 ◽  
Author(s):  
Kentaro NISHIMORI ◽  
Takefumi HIRAGURI ◽  
Hideo MAKINO

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