Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition

2013 ◽  
pp. 341-410 ◽  
Author(s):  
Daniel Schmidt ◽  
Eva Schubert ◽  
Mathias Schubert
2008 ◽  
Vol 1080 ◽  
Author(s):  
Tino Hofmann ◽  
M. Schubert ◽  
D. Schmidt ◽  
E. Schubert

ABSTRACTWe report on fabrication, structural and infrared optical characterization of nanostructure aluminum sculptured thin films prepared by glancing angle deposition (GLAD) and controlled substrate motion on p-type silicon. We discuss two structures, one with plate-like and one with screw-like (chiral) morphology. While the plate-like sample possesses a metal Drude behavior in the infrared spectral range, the chiral nanowire sample behaves non-metallic and reveals a series of intriguing resonances, which are equally spaced in frequency by ∼7.5 THz. We suggest that formation of 3D nano resonator circuits consisting of inductances and capacitances has occurred within the screw-like conductive aluminum wire sample, which might be responsible for the observed resonances. We suggest conductive GLAD nanostructures in combination with Schottky diodes to facilitate active or passive THz detector and transmitter devices.


2007 ◽  
Vol 515 (7-8) ◽  
pp. 3352-3355 ◽  
Author(s):  
Sumei Wang ◽  
Guodong Xia ◽  
Xiaoyong Fu ◽  
Hongbo He ◽  
Jianda Shao ◽  
...  

2008 ◽  
Vol 255 (5) ◽  
pp. 2192-2195 ◽  
Author(s):  
Xiudi Xiao ◽  
Guoping Dong ◽  
Cheng Xu ◽  
Hongbo He ◽  
Hongji Qi ◽  
...  

2015 ◽  
Vol 590 ◽  
pp. 111-117 ◽  
Author(s):  
A. Sinaoui ◽  
F. Chaffar-Akkari ◽  
B. Gallas ◽  
D. Demaille ◽  
M. Kanzari

2014 ◽  
Vol 115 ◽  
pp. 136-139 ◽  
Author(s):  
P. Pedrosa ◽  
C. Lopes ◽  
N. Martin ◽  
C. Fonseca ◽  
F. Vaz

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