Ellipsometry at the Nanoscale
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Published By Springer Berlin Heidelberg

9783642339554, 9783642339561
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition

2013 ◽  
pp. 341-410 ◽  
Author(s):  
Daniel Schmidt ◽  
Eva Schubert ◽  
Mathias Schubert
Keyword(s):  
Thin Films ◽  
Glancing Angle Deposition ◽  
Sculptured Thin Films ◽  
Glancing Angle ◽  
Angle Deposition

Spectroscopic Ellipsometry on Metallic Gratings

2013 ◽  
pp. 257-311 ◽  
Author(s):  
Michael Bergmair ◽  
Kurt Hingerl ◽  
Peter Zeppenfeld
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Metallic Gratings

Plasmonics and Effective-Medium Theory

2013 ◽  
pp. 203-224 ◽  
Author(s):  
David E. Aspnes
Keyword(s):  
Effective Medium Theory ◽  
Effective Medium ◽  
Medium Theory

Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale

2013 ◽  
pp. 453-491 ◽  
Author(s):  
Maria Losurdo ◽  
April S. Brown ◽  
Giovanni Bruno
Keyword(s):  
Charge Transfer ◽  
Real Time ◽  
Transfer Processes

A Brief History and State of the Art of Ellipsometry

2013 ◽  
pp. 1-30 ◽  
Author(s):  
Eugene A. Irene
Keyword(s):  
State Of The Art

Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry

2013 ◽  
pp. 629-667 ◽  
Author(s):  
Denis Cattelan ◽  
Céline Eypert ◽  
Marzouk Kloul ◽  
Mélanie Gaillet ◽  
Jean-Paul Gaston ◽  
...  
Keyword(s):  
Thin Film ◽  
Spectroscopic Ellipsometry

Advanced Mueller Ellipsometry Instrumentation and Data Analysis

2013 ◽  
pp. 31-143 ◽  
Author(s):  
Enric Garcia-Caurel ◽  
Razvigor Ossikovski ◽  
Martin Foldyna ◽  
Angelo Pierangelo ◽  
Bernard Drévillon ◽  
...  
Keyword(s):  
Data Analysis
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