Ellipsometry at the Nanoscale
Latest Publications

TOTAL DOCUMENTS

21

(FIVE YEARS 0)

H-INDEX

4

(FIVE YEARS 0)

Published By Springer Berlin Heidelberg

9783642339554, 9783642339561

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_10 ◽

2013 ◽

pp. 341-410 ◽

Cited By ~ 5

Author(s):

Daniel Schmidt ◽

Eva Schubert ◽

Mathias Schubert

Keyword(s):

Thin Films ◽

Glancing Angle Deposition ◽

Sculptured Thin Films ◽

Glancing Angle ◽

Angle Deposition

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Polarimetric and Other Optical Probes for the Solid–Liquid Interface

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_14 ◽

2013 ◽

pp. 493-527 ◽

Cited By ~ 1

Author(s):

Kurt Hingerl

Keyword(s):

Liquid Interface ◽

Optical Probes ◽

Solid Liquid Interface ◽

Solid Liquid

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Spectroscopic Ellipsometry on Metallic Gratings

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_7 ◽

2013 ◽

pp. 257-311 ◽

Cited By ~ 3

Author(s):

Michael Bergmair ◽

Kurt Hingerl ◽

Peter Zeppenfeld

Keyword(s):

Spectroscopic Ellipsometry ◽

Metallic Gratings

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Plasmonics and Effective-Medium Theory

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_5 ◽

2013 ◽

pp. 203-224 ◽

Cited By ~ 1

Author(s):

David E. Aspnes

Keyword(s):

Effective Medium Theory ◽

Effective Medium ◽

Medium Theory

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Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_3 ◽

2013 ◽

pp. 145-178 ◽

Cited By ~ 3

Author(s):

Josef Humlicek

Keyword(s):

Data Analysis ◽

Effective Medium ◽

Effective Medium Approximation

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Spectroscopic Ellipsometry for Functional Nano-Layers of Flexible Organic Electronic Devices

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_15 ◽

2013 ◽

pp. 529-556 ◽

Cited By ~ 1

Author(s):

Stergios Logothetidis ◽

Argiris Laskarakis

Keyword(s):

Spectroscopic Ellipsometry ◽

Electronic Devices ◽

Organic Electronic Devices ◽

Organic Electronic

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Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_13 ◽

2013 ◽

pp. 453-491 ◽

Cited By ~ 1

Author(s):

Maria Losurdo ◽

April S. Brown ◽

Giovanni Bruno

Keyword(s):

Charge Transfer ◽

Real Time ◽

Transfer Processes

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A Brief History and State of the Art of Ellipsometry

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_1 ◽

2013 ◽

pp. 1-30 ◽

Cited By ~ 3

Author(s):

Eugene A. Irene

Keyword(s):

State Of The Art

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Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_19 ◽

2013 ◽

pp. 629-667 ◽

Cited By ~ 1

Author(s):

Denis Cattelan ◽

Céline Eypert ◽

Marzouk Kloul ◽

Mélanie Gaillet ◽

Jean-Paul Gaston ◽

...

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry

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Advanced Mueller Ellipsometry Instrumentation and Data Analysis

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_2 ◽

2013 ◽

pp. 31-143 ◽

Cited By ~ 16

Author(s):

Enric Garcia-Caurel ◽

Razvigor Ossikovski ◽

Martin Foldyna ◽

Angelo Pierangelo ◽

Bernard Drévillon ◽

...

Keyword(s):

Data Analysis

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