Ellipsometry at the Nanoscale
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TOTAL DOCUMENTS

21

(FIVE YEARS 0)

H-INDEX

4

(FIVE YEARS 0)

Published By Springer Berlin Heidelberg

9783642339554, 9783642339561

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Polarimetric and Other Optical Probes for the Solid–Liquid Interface

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_14 ◽

2013 ◽

pp. 493-527 ◽

Author(s):

Kurt Hingerl

Keyword(s):

Liquid Interface ◽

Optical Probes ◽

Solid Liquid Interface ◽

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Spectroscopic Ellipsometry on Metallic Gratings

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_7 ◽

2013 ◽

pp. 257-311 ◽

Author(s):

Michael Bergmair ◽

Kurt Hingerl ◽

Peter Zeppenfeld

Keyword(s):

Spectroscopic Ellipsometry ◽

Metallic Gratings

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Plasmonics and Effective-Medium Theory

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_5 ◽

2013 ◽

pp. 203-224 ◽

Author(s):

David E. Aspnes

Keyword(s):

Effective Medium Theory ◽

Effective Medium ◽

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Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_3 ◽

2013 ◽

pp. 145-178 ◽

Author(s):

Josef Humlicek

Keyword(s):

Data Analysis ◽

Effective Medium ◽

Effective Medium Approximation

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Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_10 ◽

2013 ◽

pp. 341-410 ◽

Author(s):

Daniel Schmidt ◽

Eva Schubert ◽

Mathias Schubert

Keyword(s):

Glancing Angle Deposition ◽

Sculptured Thin Films ◽

Glancing Angle ◽

Angle Deposition

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A Brief History and State of the Art of Ellipsometry

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_1 ◽

2013 ◽

pp. 1-30 ◽

Author(s):

Eugene A. Irene

Keyword(s):

State Of The Art

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Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_19 ◽

2013 ◽

pp. 629-667 ◽

Author(s):

Denis Cattelan ◽

Céline Eypert ◽

Marzouk Kloul ◽

Mélanie Gaillet ◽

Jean-Paul Gaston ◽

...

Keyword(s):

Thin Film ◽

Spectroscopic Ellipsometry

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Advanced Mueller Ellipsometry Instrumentation and Data Analysis

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_2 ◽

2013 ◽

pp. 31-143 ◽

Author(s):

Enric Garcia-Caurel ◽

Razvigor Ossikovski ◽

Martin Foldyna ◽

Angelo Pierangelo ◽

Bernard Drévillon ◽

...

Keyword(s):

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Ellipsometry of Semiconductor Nanocrystals

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_17 ◽

2013 ◽

pp. 583-606

Author(s):

Peter Petrik ◽

Miklos Fried

Keyword(s):

Semiconductor Nanocrystals

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Spectroscopic Ellipsometry for Functional Nano-Layers of Flexible Organic Electronic Devices

Ellipsometry at the Nanoscale ◽

10.1007/978-3-642-33956-1_15 ◽

2013 ◽

pp. 529-556 ◽

Author(s):

Stergios Logothetidis ◽

Argiris Laskarakis

Keyword(s):

Spectroscopic Ellipsometry ◽

Electronic Devices ◽

Organic Electronic Devices ◽

Organic Electronic

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