High Resolution Optical Time Domain Reflectometry for the Characterization of Integrated Optical Devices

Author(s):  
P. Beaud ◽  
J. Schütz ◽  
W. Hodel ◽  
H. P. Weber
1997 ◽  
Vol 3 (2) ◽  
pp. 168-172 ◽  
Author(s):  
N Katcharov ◽  
J Rioublanc ◽  
J.L Auguste ◽  
J.M Blondy ◽  
P Di Bin

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