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High Resolution Optical Time Domain Reflectometry for the Characterization of Integrated Optical Devices
Springer Proceedings in Physics - Ultrafast Phenomena in Spectroscopy
◽
10.1007/978-3-642-75826-3_21
◽
1990
◽
pp. 111-116
Author(s):
P. Beaud
◽
J. Schütz
◽
W. Hodel
◽
H. P. Weber
Keyword(s):
High Resolution
◽
Time Domain
◽
Optical Devices
◽
Time Domain Reflectometry
◽
Optical Time Domain Reflectometry
◽
Integrated Optical
◽
Integrated Optical Devices
◽
Optical Time
Download Full-text
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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