Surface States, Surface Effects

Springer Series in Solid-State Sciences - Photoelectron Spectroscopy ◽

10.1007/978-3-662-03150-6_8 ◽

1995 ◽

pp. 367-402

Author(s):

Stefan Hüfner

Keyword(s):

Surface States ◽

Surface Effects

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Surface States, Surface Effects

Photoelectron Spectroscopy - Advanced Texts in Physics ◽

10.1007/978-3-662-09280-4_8 ◽

2003 ◽

pp. 501-549 ◽

Cited By ~ 3

Author(s):

Stefan Hüfner

Keyword(s):

Surface States ◽

Surface Effects

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Surface States in Passivated, Unpassivated and Core/Shell Nanocrystals: Electronic Structure and Optical Properties

MRS Proceedings ◽

10.1557/proc-789-n13.2 ◽

2003 ◽

Vol 789 ◽

Cited By ~ 4

Author(s):

Garnett W. Bryant ◽

W. Jaskolski

Keyword(s):

Optical Properties ◽

Electronic Structure ◽

Semiconductor Nanocrystals ◽

Tight Binding ◽

Surface States ◽

Surface Effects ◽

Atomic Scale ◽

Core Shell ◽

Binding Theory ◽

Theoretical Understanding

ABSTRACTSurface effects significantly influence the functionality of semiconductor nanocrystals. A theoretical understanding of these surface effects requires models capable of describing surface details at an atomic scale, passivation with molecular ligands, and few-monolayer capping shells. We present an atomistic tight-binding theory of the electronic structure and optical properties of passivated, unpassivated and core/shell nanocrystals to study these surface effects.

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Zero-loss omega-filtered REM and RHEED on the new Zeiss 912

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087392 ◽

1991 ◽

Vol 49 ◽

pp. 616-617

Author(s):

J.C.H. Spence ◽

J. Mayer

Keyword(s):

Electron Microscopy ◽

Materials Science ◽

Surface States ◽

Ccd Camera ◽

Dark Field ◽

Ion Pump ◽

Magnetic Imaging ◽

Reflection Electron Microscopy ◽

Diffraction Patterns ◽

Large Background

The Zeiss 912 is a new fully digital, side-entry, 120 Kv TEM/STEM instrument for materials science, fitted with an omega magnetic imaging energy filter. Pumping is by turbopump and ion pump. The magnetic imaging filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient parallel (area) detection. The energy loss intensity distribution may also be displayed on the screen, and recorded by scanning it over the PMT supplied. If a CCD camera is fitted and suitable new software developed, “parallel ELS” recording results. For large fields of view, filtered images can be recorded much more efficiently than by Scanning Reflection Electron Microscopy, and the large background of inelastic scattering removed. We have therefore evaluated the 912 for REM and RHEED applications. Causes of streaking and resonance in RHEED patterns are being studied, and a more quantitative analysis of CBRED patterns may be possible. Dark field band-gap REM imaging of surface states may also be possible.

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