Photon Counting

1991 ◽  
pp. 232-278
Author(s):  
Crispin W. Gardiner
Keyword(s):  
Photon Counting

Tantalum superconducting tunnel junctions for photon counting detectors

2002 ◽  
Vol 12 (3) ◽  
pp. 145-148
Author(s):  
C. Jorel ◽  
P. Feautrier ◽  
J.-C. Villégier ◽  
A. Benoit
Keyword(s):  
Tunnel Junctions ◽  
Photon Counting ◽  
Superconducting Tunnel Junctions ◽  
Photon Counting Detectors

Spektrale Photon-Counting Computertomografie für Mehrphasen-Leberdiagnostik mit zwei Kontrastmitteln

2017 ◽  
Vol 189 (S 01) ◽  
pp. S1-S124
Author(s):  
D Münzel ◽  
H Daerr ◽  
R Proksa ◽  
A Fingerle ◽  
P Douek ◽  
...  
Keyword(s):  
Photon Counting

Spektrale Photon-Counting Computertomografie: Anwendung für die virtuelle Koloskopie ohne Abführen

2017 ◽  
Vol 189 (S 01) ◽  
pp. S1-S124
Author(s):  
D Münzel ◽  
D Bar-Ness ◽  
E Roessl ◽  
A Fingerle ◽  
H Daerr ◽  
...  
Keyword(s):  
Photon Counting ◽  
Virtuelle Koloskopie

Development of a photon counting hybrid CCD digicon detector

1983 ◽  
Author(s):  
J. FLEMING ◽  
S. RUSSAK
Keyword(s):  
Photon Counting

Prospects of Time-Resolved Photon Emission as a Debug Tool

2002 ◽  
Author(s):  
Jim Vickers ◽  
Nader Pakdaman ◽  
Steven Kasapi
Keyword(s):  
Photon Emission ◽  
Photon Counting ◽  
Signal Propagation ◽  
General Function ◽  
Hot Electron ◽  
Detector Performance ◽  
Time Resolved ◽  
Switching Event ◽  
Emission System

Abstract Dynamic hot-electron emission using time-resolved photon counting can address the long-term failure analysis and debug requirements of the semiconductor industry's advanced devices. This article identifies the detector performance parameters and components that are required to scale and keep pace with the industry's requirements. It addresses the scalability of dynamic emission with the semiconductor advanced device roadmap. It is important to understand the limitations to determining that a switching event has occurred. The article explains the criteria for event detection, which is suitable for tracking signal propagation and looking for logic or other faults in which timing is not critical. It discusses conditions for event timing, whose goal is to determine accurately when a switching event has occurred, usually for speed path analysis. One of the uses of a dynamic emission system is to identify faults by studying the emission as a general function of time.

Single Point PICA Probing with an Avalanche Photo-Diode

2001 ◽  
Author(s):  
Mike Bruce ◽  
Rama R. Goruganthu ◽  
Shawn McBride ◽  
David Bethke ◽  
J.M. Chin
Keyword(s):  
Single Photon ◽  
Single Point ◽  
Photon Counting ◽  
Ring Oscillator ◽  
Time Resolved ◽  
Single Photon Counting ◽  
Photo Diode ◽  
Avalanche Photo Diode ◽  
Photo Multiplier Tube ◽  
Channel Plate

Abstract For time resolved hot carrier emission from the backside, an alternate approach is demonstrated termed single point PICA. The single point approach records time resolved emission from an individual transistor using time-correlated-single-photon counting and an avalanche photo-diode. The avalanche photo-diode has a much higher quantum efficiency than micro-channel plate photo-multiplier tube based imaging cameras typically used in earlier approaches. The basic system is described and demonstrated from the backside on a ring oscillator circuit.

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