Cyclic Strain Localization in Fatigued Metals

2001 ◽  
pp. 271-281 ◽  
Author(s):  
Hael Mughrabi
1990 ◽  
Vol 24 (2) ◽  
pp. 415-419 ◽  
Author(s):  
Jaroslav Polák ◽  
Jan Helešic ◽  
Karel Obrtlík

2010 ◽  
Vol 90 (1) ◽  
pp. 69-76 ◽  
Author(s):  
B. Zhang ◽  
K.H. Sun ◽  
Y. Liu ◽  
G.P. Zhang

2005 ◽  
Vol 475-479 ◽  
pp. 3647-3650 ◽  
Author(s):  
G.P. Zhang ◽  
Cynthia A. Volkert ◽  
Ruth Schwaiger ◽  
Oliver Kraft

Fatigue damage behaviour in micron and sub-micron thick Cu films has been investigated using focused ion beam (FIB) microscopy and transmission electron microscopy (TEM). The observations show that cyclic strain localization in the fatigued thin films is affected by the physical dimensions of the material, as evidenced by changes in the extrusion dimensions and by changes in the dislocation structures. The significant decrease in extrusion dimensions and the suppression of the development of bulk-like dislocation structures with decreasing film thickness and grain size is attributed to the strong inhibition of dislocation mobility and activity at small length scales.


Author(s):  
Jean-Bernard Vogt ◽  
Jérémie Bouquerel ◽  
Ingrid Proriol Serre

2012 ◽  
Vol 39 ◽  
pp. 44-53 ◽  
Author(s):  
J. Man ◽  
T. Vystavěl ◽  
A. Weidner ◽  
I. Kuběna ◽  
M. Petrenec ◽  
...  

1990 ◽  
Vol 24 (12) ◽  
pp. 2309-2314 ◽  
Author(s):  
D.J. Morrison ◽  
J.W. Jones ◽  
G.S. Was

1991 ◽  
Vol 25 (6) ◽  
pp. 1299-1304 ◽  
Author(s):  
D.J Morrison ◽  
V Chopra ◽  
J.W Jones

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