A Polarimetric Model for Multi-Path Imaging/Identification Analysis Using Poly-Static (Bi-Static Plus Mono-Static) Scattering Matrix Data

1992 ◽  
pp. 707-738
Author(s):  
Sujeet K. Chaudhuri ◽  
Wolfgang-M. Boerner
Keyword(s):  
Scattering Matrix ◽  
Identification Analysis

“Preparation of Single Crystalline Gold Films for ED Studies”

1972 ◽  
Vol 30 ◽  
pp. 634-635
Author(s):  
Joseph D. C. Peng
Keyword(s):  
Crystal Morphology ◽  
Diffraction Theory ◽  
Scattering Matrix ◽  
Vacuum Evaporation ◽  
Gold Films ◽  
Matrix Formulation ◽  
Silver Films ◽  
Single Crystalline ◽  
Grating Pattern ◽  
Stacking Disorder

The relative intensities of the ED spots in a cross-grating pattern can be calculated using N-beam electron diffraction theory. The scattering matrix formulation of N-beam ED theory has been previously applied to imperfect microcrystals of gold containing stacking disorder (coherent twinning) in the (111) crystal plane. In the present experiment an effort has been made to grow single-crystalline, defect-free (111) gold films of a uniform and accurately know thickness using vacuum evaporation techniques. These represent stringent conditions to be met experimentally; however, if a meaningful comparison is to be made between theory and experiment, these factors must be carefully controlled. It is well-known that crystal morphology, perfection, and orientation each have pronounced effects on relative intensities in single crystals.The double evaporation method first suggested by Pashley was employed with some modifications. Oriented silver films of a thickness of about 1500Å were first grown by vacuum evaporation on freshly cleaved mica, with the substrate temperature at 285° C during evaporation with the deposition rate at 500-800Å/sec.

Reduction of the scattering matrix array

2015 ◽  
Vol 185 (9) ◽  
pp. 941-945 ◽  
Author(s):  
Ivan A. Sadovskyy
Keyword(s):  
Scattering Matrix ◽  
Matrix Array

Scattering Matrix in the DKP Theory. Barrier Potential Case

2014 ◽  
Vol 59 (6) ◽  
pp. 565-568 ◽  
Author(s):  
Boutabia-Chéraitia B. Boutabia-Chéraitia B. ◽  
◽  
Boudjedaa T. Boudjedaa T. ◽  
Keyword(s):  
Scattering Matrix ◽  
Barrier Potential ◽  
Potential Case

scholarly journals Anisotropic dielectric susceptibility matrix of anisotropic medium

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Wanrong Gao
Keyword(s):  
Light Scattering ◽  
Anisotropic Medium ◽  
Polarized Light ◽  
Scattering Matrix ◽  
Dielectric Susceptibility ◽  
Anisotropic Dielectric ◽  
New Methods ◽  
Mueller Matrices ◽  
Anisotropic Structures ◽  
The Fourier Transform

AbstractIn this work, we introduce the concept of anisotropic dielectric susceptibility matrix of anisotropic medium for both nondepolarizing and depolarizing medium. The concept provides a new way of analyzing light scattering properties of anisotropic media illuminated by polarized light. The explicit expressions for the elements of the scattering matrix are given in terms of the elements of the Fourier transform of the anisotropic dielectric susceptibility matrix of the medium. Finally, expressions for the elements of the Jones matrix of a thin layer of a deterministic anisotropic medium and the elements of the Mueller matrix of a depolarizing medium are given. The results obtained in this work is helpful for deriving information about the correlated anisotropic structures in depolarizing media from measured Mueller matrices. The findings in this work may also well prove stimulating to researchers working on new methods for analyzing light scattering properties.

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