A Formal Perspective on Effective Post-silicon Debug and Trace Signal Selection
2019 ◽
Vol 38
(4)
◽
pp. 767-779
◽
2012 ◽
Vol 31
(3)
◽
pp. 442-446
◽
2014 ◽
Vol 33
(7)
◽
pp. 1081-1094
◽