In-situ investigation of ZnS deposition on mica by successive ionic layer adsorption and reaction method as studied with atomic force microscopy

1995 ◽  
Vol 353 (5-8) ◽  
pp. 772-777 ◽  
Author(s):  
R. Resch ◽  
T. Prohaska ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
T. Kanniainen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Reaction Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layer Adsorption ◽  
In Situ Investigation ◽  
Ionic Layer

Atomic force microscopy studies of ZnS films grown on (100) GaAs by the successive ionic layer adsorption and reaction method

1998 ◽  
Vol 13 (6) ◽  
pp. 1688-1692 ◽  
Author(s):  
Mika P. Valkonen ◽  
Seppo Lindroos ◽  
Tapio Kanniainen ◽  
Markku Leskelä ◽  
Roland Resch ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layer Adsorption ◽  
Silar Technique ◽  
Ionic Layer

In this study zinc sulfide thin films were grown by the successive ionic layer adsorption and reaction (SILAR) technique on (100) GaAs substrates from aqueous precursor solutions. The atomic force microscopy (AFM) method was used to study the growth of the films up to a thickness of 180 nm. The ZnS thin films on (100) GaAs were smooth with an rms roughness of 0.2–1.9 nm depending on the film thickness. After the GaAs surface was covered with ZnS, the growth appeared to be nearly layerwise. In addition, in situ AFM studies were carried out to analyze the dissolution of (100) GaAs in water, which is a process competing with the thin film deposition by the SILAR.

Growth of zinc sulfide thin films on (100)Si with the successive ionic layer adsorption and reaction method studied by atomic force microscopy

1998 ◽  
Vol 136 (1-2) ◽  
pp. 131-136 ◽  
Author(s):  
Mika P Valkonen ◽  
Seppo Lindroos ◽  
Roland Resch ◽  
Markku Leskelä ◽  
Gernot Friedbacher ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Zinc Sulfide ◽  
Reaction Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layer Adsorption ◽  
Ionic Layer

Growth of zinc sulfide thin films with the successive ionic layer adsorption and reaction method as studied by atomic force microscopy

1995 ◽  
Vol 5 (7) ◽  
pp. 985-989 ◽  
Author(s):  
T. Kanniainen ◽  
S. Lindroos ◽  
T. Prohaska ◽  
G. Friedbacher ◽  
M. Leskelä ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Zinc Sulfide ◽  
Reaction Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Layer Adsorption ◽  
Ionic Layer

In-situ investigation of surface processes on AlGaAs/GaAs cleavage edges as studied by atomic force microscopy

1995 ◽  
Vol 353 (5-8) ◽  
pp. 670-674
Author(s):  
T. Prohaska ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
H. Nickel ◽  
R. L�sch ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Processes ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation

In Situ Investigation of Aluminum Gallium Arsenide/Gallium Arsenide Multilayer Structures under Inert and Reactive Media by Atomic Force Microscopy

1995 ◽  
Vol 67 (9) ◽  
pp. 1530-1535 ◽  
Author(s):  
Thomas. Prohaska ◽  
Gernot. Friedbacher ◽  
Manfred. Grasserbauer ◽  
Heinrich. Nickel ◽  
Rainer. Loesch ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Gallium Arsenide ◽  
Aluminum Gallium Arsenide ◽  
Multilayer Structures ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation ◽  
Reactive Media

In-situ investigation of aerosol particles by atomic force microscopy

1998 ◽  
Vol 361 (6-7) ◽  
pp. 716-721 ◽  
Author(s):  
G. Köllensperger ◽  
G. Friedbacher ◽  
M. Grasserbauer
Keyword(s):  
Atomic Force Microscopy ◽  
Aerosol Particles ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation
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