Layer-by-layer analysis of A4B6 thin-film heterostructures using inductively coupled plasma atomic fluorescence spectrometry (ICP-AFS)
1994 ◽
Vol 349
(6)
◽
pp. 424-427
◽
1990 ◽
Vol 45
(3)
◽
pp. 341-349
◽
1989 ◽
Vol 4
(1)
◽
pp. 55
◽
1986 ◽
Vol 41
(12)
◽
pp. 1299-1321
◽