On the calculation of field isotope shifts for optical spectral lines

1984 ◽  
Vol 315 (1) ◽  
pp. 123-124 ◽  
Author(s):  
Dieter Zimmermann

The spectral lines λ226.5, λ441.6, λ806.7 and λ853.3 nm of Cd II and λ508.6 nm of Cd I have been studied under high resolution by means of digital recording interferometry. The relative positions of all the stable isotopes of cadmium in all the lines have been deduced from the measurements. The main object of this study was to provide precise data for the simple p–s transitions λ226.5, λ806.7 and λ853.3 nm. Such lines are the most favourable for theoretical interpretation, and the new results are intended to provide a basis for the separation of mass and field effects in measured isotope shifts in cadmium. The hyperfine structure intervals, which are important in the interpretation of isotope shifts, have also been measured for all the levels involved in the five transitions.


1981 ◽  
Vol 301 (2) ◽  
pp. 95-99 ◽  
Author(s):  
K. A. H. Leeuwen ◽  
E. R. Eliel ◽  
B. H. Post ◽  
W. Hogervorst

1977 ◽  
Vol 36 ◽  
pp. 191-215
Author(s):  
G.B. Rybicki

Observations of the shapes and intensities of spectral lines provide a bounty of information about the outer layers of the sun. In order to utilize this information, however, one is faced with a seemingly monumental task. The sun’s chromosphere and corona are extremely complex, and the underlying physical phenomena are far from being understood. Velocity fields, magnetic fields, Inhomogeneous structure, hydromagnetic phenomena – these are some of the complications that must be faced. Other uncertainties involve the atomic physics upon which all of the deductions depend.


Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.


1979 ◽  
Vol 40 (C7) ◽  
pp. C7-741-C7-742
Author(s):  
S. Chyrczakowski ◽  
K. Melzacki ◽  
M. Sadowski

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