Optical feedback effect on bistable laser diodes

1987 ◽  
Vol 19 (S1) ◽  
pp. S75-S82 ◽  
Author(s):  
Akihisa Tomita ◽  
Akira Suzuki
2020 ◽  
pp. 144-148

Chaos synchronization of delayed quantum dot light emitting diode has been studied theortetically which are coupled via the unidirectional and bidirectional. at synchronization of chaotic, The dynamics is identical with delayed optical feedback for those coupling methods. Depending on the coupling parameters and delay time the system exhibits complete synchronization, . Under proper conditions, the receiver quantum dot light emitting diode can be satisfactorily synchronized with the transmitter quantum dot light emitting diode due to the optical feedback effect.


2020 ◽  
Vol 12 (2) ◽  
pp. 02030-1-02030-5
Author(s):  
Sanjay J. Patel ◽  
◽  
Akshay Jariwala ◽  
C. J. Panchal ◽  
Vipul Kheraj ◽  
...  

1991 ◽  
Vol 9 (4) ◽  
pp. 468-476 ◽  
Author(s):  
J. Helms ◽  
K. Petermann

1992 ◽  
Author(s):  
Jun-ichi Kato ◽  
Ichirou Yamaguchi ◽  
Nobuhiko Kikuchi ◽  
Shigeo Ozono

1981 ◽  
Vol 38 (4) ◽  
pp. 217-220 ◽  
Author(s):  
Masahiko Fujiwara ◽  
Keiichi Kubota ◽  
Roy Lang

1997 ◽  
Vol 482 ◽  
Author(s):  
Shuji Nakamura

AbstractInGaN multi-quantum-well (MQW) structure laser diodes with A10.14Ga0.86N/GaN modulation doped strained-layer superlattice cladding layers grown on an epitaxially laterally overgrown GaN substrate were demonstrated to have an estimated lifetime of more than 10,000 hours under continuous-wave operation at 20°C. Under operation at a high temperature of 50°C, the lifetime was longer than 1,000 hours. The activation energy of the lifetime was estimated to be 0.5 eV. With the operating current increasing above the threshold, a self-pulsation with a high frequency of 3.5 GHz was observed. The relative intensity noise (RIN) less than -145 dB/Hz was obtained even at the 6% optical feedback using the high-frequency modulation of 600 MHz. The threshold carrier density of the InGaN MQW-structure LDs was estimated to be 3 × 1019/cm3 using a carrier lifetime of 1.8 ns.


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