High temperature oxidation of iron at 1200 °C in a hot-stage environmental scanning electron microscope

Metallurgical Transactions A ◽

10.1007/bf02647106 ◽

1984 ◽

Vol 15 (12) ◽

pp. 2231-2240 ◽

Author(s):

Thomas L. Jungling ◽

Robert A. Rapp

Keyword(s):

Electron Microscope ◽

High Temperature ◽

Scanning Electron Microscope ◽

High Temperature Oxidation ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Temperature Oxidation ◽

Scanning Electron

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High-temperature oxidation of nickel and chromium studied with an in-situ environmental scanning electron microscope

Scanning ◽

10.1002/sca.4950230406 ◽

2006 ◽

Vol 23 (4) ◽

pp. 255-266 ◽

Author(s):

B. Schmid ◽

N. Aas ◽

Ø. Grong ◽

R. Ødegård

Keyword(s):

Electron Microscope ◽

High Temperature ◽

Scanning Electron Microscope ◽

High Temperature Oxidation ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Temperature Oxidation ◽

Scanning Electron

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Use of a micromanipulator at high temperature in an environmental scanning electron microscope to apply force during the sintering of copper particles

Scripta Materialia ◽

10.1016/j.scriptamat.2006.06.029 ◽

2006 ◽

Vol 55 (8) ◽

pp. 707-710 ◽

Author(s):

A.J. Smith ◽

H.V. Atkinson ◽

S.V. Hainsworth ◽

A.C.F. Cocks

Keyword(s):

Electron Microscope ◽

High Temperature ◽

Scanning Electron Microscope ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Copper Particles ◽

Scanning Electron

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Design of a micromanipulation system for high temperature operation in an environmental scanning electron microscope (ESEM)

Journal of Micromechanics and Microengineering ◽

10.1088/0960-1317/17/1/014 ◽

2006 ◽

Vol 17 (1) ◽

pp. 104-114 ◽

Author(s):

P Samara-Ratna ◽

H V Atkinson ◽

T Stevenson ◽

S V Hainsworth ◽

J Sykes

Keyword(s):

Electron Microscope ◽

High Temperature ◽

Scanning Electron Microscope ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

High Temperature Operation ◽

Scanning Electron

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Observation of the swelling behavior of kraft fibers and sheets in the environmental scanning electron microscope

Nordic Pulp & Paper Research Journal ◽

10.3183/npprj-1998-13-04-p280-284 ◽

1998 ◽

Vol 13 (4) ◽

pp. 280-284 ◽

Author(s):

Toshiharu Enomae ◽

Pierre Lepoutre

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Swelling Behavior ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Scanning Electron

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A Brief Overview of In-Situ Mechanical Testing in the Environmental Scanning Electron Microscope

Micro and Nanosystems ◽

10.2174/1876402911204020092 ◽

2012 ◽

Vol 4 (2) ◽

pp. 92-96 ◽

Author(s):

Kalin I. Dragnevski

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Mechanical Testing ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

In Situ Mechanical Testing ◽

Scanning Electron

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Tensile Tests of Polymers at Low Temperatures in the Environmental Scanning Electron Microscope: An Improved Cooling Platform

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10.1002/sca.20075 ◽

2007 ◽

Vol 29 (6) ◽

pp. 261-269 ◽

Author(s):

A. Zankel ◽

P. Poelt ◽

M. Gahleitner ◽

E. Ingolic ◽

C. Grein

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Low Temperatures ◽

Tensile Tests ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Scanning Electron

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Observations of water-clay reactions in water-sensitive sandstone and mudrocks using an environmental scanning electron microscope

Journal of Petroleum Science and Engineering ◽

10.1016/0920-4105(94)90082-5 ◽

1994 ◽

Vol 10 (3) ◽

pp. 211-222 ◽

Author(s):

Jennifer M. Huggett ◽

Philippa J.R. Uwins

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Scanning Electron

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Image intensity matching technique: Application to the environmental scanning electron microscope

Computational Materials Science ◽

10.1016/0927-0256(94)90106-6 ◽

1994 ◽

Vol 2 (2) ◽

pp. 249-260 ◽

Author(s):

Yunping Xi ◽

Todd B. Bergstrom ◽

Hamlin M. Jennings

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Image Intensity ◽

Matching Technique ◽

Scanning Electron

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Micromodification of silicon dioxide in a variable pressure/environmental scanning electron microscope

Applied Physics Letters ◽

10.1063/1.1415773 ◽

2001 ◽

Vol 79 (19) ◽

pp. 3050-3052 ◽

Author(s):

Marion A. Stevens-Kalceff

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Silicon Dioxide ◽

Environmental Scanning Electron Microscope ◽

Variable Pressure ◽

Environmental Scanning ◽

Scanning Electron

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Analysis of membrane electrode assembly (MEA) by environmental scanning electron microscope (ESEM)

Journal of Power Sources ◽

10.1016/j.jpowsour.2004.12.069 ◽

2005 ◽

Vol 145 (2) ◽

pp. 216-222 ◽

Author(s):

H.M. Yu ◽

J.O. Schumacher ◽

M. Zobel ◽

C. Hebling

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Membrane Electrode Assembly ◽

Environmental Scanning Electron Microscope ◽

Environmental Scanning ◽

Membrane Electrode ◽

Scanning Electron

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