Three-dimensional analysis of high voltage electron microscope tilt images: Methods and problems

1987 ◽  
Vol 6 (2) ◽  
pp. 185-192 ◽  
Author(s):  
Kiyoshi Hama ◽  
Tatsuo Arii
Author(s):  
Kiyoshi Hama ◽  
Toshio Kosaka

The stereo-observation of biological materials can effectively achieved by the high voltage electron microscope utilizing the high penetration power of electrons at high accelerating voltage which enables the observation of thick specimens, and the large depth of forcus resulted by the small angular aperture used in the electron microscope (Hama, 1972). The high voltage electron microscope was applied to the study of the neuroglial cell processes in the cerebellar cortex of monkey and rat by Chang-Palayand Palay (1972). We investigated further the three dimensional organization of the neuroglial cell processes in the cerebellum and retina of rat by means of high voltage electron microscope stereoscopy.The Golgi preparations of cerebellar cortex and retina of rat were prepared by the methods described previously (Stell and Lightfoot, 1975; Colonnier, 1964). Plastic sections 100 μm thick were used for the light microscope observation.


Author(s):  
J.N. Turner ◽  
D.P. Barnard ◽  
G. Matuszek ◽  
C.W. See

A high precision specimen stage is essential for the accurate recording of images for three-dimensional reconstruction. The efficient calculation and resolution of a “tomographic type” three-dimensional reconstruction is influenced by the precision of the angular tilt settings. The ability to identify structures at low magnification and later return to them for detailed study at high magnification is crucial to the efficient study of structures by serial section reconstruction, and is greatly aided by a precise, repeatable translation stage. To study such problems, we have designed and fabricated a single-tilt specimen stage for our high-voltage electron microscope (HVEM), which represents a different design philosophy to that usually employed in side entry stages for transmission electron microscopes.


Author(s):  
Murray Vernon King ◽  
Donald F. Parsons

One of the major concerns of biological electron microscopists has been that of obtaining images of biological specimens with minimal radiation damage. The problem of designing more sensitive imaging devices and materials for the high-voltage electron microscope (HVEM) becomes pressing because: 1) the relative insensitivity of conventional photographic materials to 1-MeV electrons requires inordinately long exposures unless measures are taken to enhance the sensitivity of photographic recording; 2) the relative insensitivity of conventional viewing screens requires excessive beam intensities for scanning the specimen and focusing the image unless means are found to obtain a visible image at lower beam current densities; 3) an increasing part of the practice of high-voltage electron microscopy has involved taking multiple images from the same specimen area, as in taking stereo pairs or more extensive tilt series for three-dimensional reconstruction --- this feature is inherent in high-voltage electron microscopy, and it is occasioned by the wealth of detail offered by semithin sections, which requires three-dimensional methods for decipherment


Author(s):  
B.F. McEwen ◽  
M.J. Song ◽  
A. Ruknudin ◽  
D.P. Barnard ◽  
J. Frank ◽  
...  

Patch-clamped membranes have revolutionized the field of cellular electrophysiology, but nothing was known about their ultrastructure until they were imaged using the high-voltage electron microscope (HVEM). In present study we compute a tomographic three-dimensional (3D) reconstruction ofpatch-clamped membranes made from a Xenopus oocyte according to standard techniques. The sample was prepared for viewing in the HVEM according to the dry-mounting technique previously described. A tilt series was collected with a 2° angular interval and an angular range from -64° to 66°. All micrographs were recorded at 1 MV (Fig. 1). Our alignment procedure was hampered by the lack of good fiduciary markers and the presence of the wall of the micropipette, however, we were able to compute a preliminary reconstruction of reasonable quality using the weighted back projection method.Tomograms from the 3D reconstruction demonstrate that the cylindrical axis of the micropipette was not coaxial with the tilt axis of the HVEM state (Fig. 2). The reconstruction was rotated until it was coaxial with the y-axis of the reconstruction volume and a series of cylindrical projections were computed (Fig. 3). The projections from the inner radii show the thin profile of the disk which spans the micropipette, while the projections at larger radii show the distribution of features along the wall or the micropipette. The blurred area in the middle (and at the ends) of each cylindrical projection is caused by the missing angular range, while the blank area in the longest projection is a result of the slightly elliptical cross-section of the micropipette. A small 3D volume containing the pipette-spanning disk was extracted from the reconstruction volume (Fig. 4); the fibrous nature of the disk is evident. A different view of the disk is presented by removing tomograms which contain interfering features from the front and back walls of micropipette from the reconstruction in its original orientation (Fig. 5).


Author(s):  
J.L. Williams ◽  
K. Heathcote ◽  
E.J. Greer

High Voltage Electron Microscope already offers exciting experimental possibilities to Biologists and Materials Scientists because the increased specimen thickness allows direct observation of three dimensional structure and dynamic experiments on effectively bulk specimens. This microscope is designed to give maximum accessibility and space in the specimen region for the special stages which are required. At the same time it provides an ease of operation similar to a conventional instrument.


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