Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups

2017 ◽  
Vol 39 (1-4) ◽  
pp. 94-108 ◽  
Author(s):  
Mario Lanza ◽  
Umberto Celano ◽  
Feng Miao
Keyword(s):  
Atomic Force Microscopy ◽  
Resistive Switching ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

2010 ◽  
Vol 30 (7) ◽  
pp. 1761-1764 ◽  
Author(s):  
Martin Schloffer ◽  
Christian Teichert ◽  
Peter Supancic ◽  
Andrei Andreev ◽  
Yue Hou ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Shape and size of epididymal sperm from Gir bulls using atomic force microscopy: A nanoscale characterization of epididymal sperm

2020 ◽  
Vol 20 (1) ◽  
pp. 37-41
Author(s):  
Andrielle Thainar Mendes Cunha ◽  
Luciano Paulino Silva ◽  
José Oliveira Carvalho ◽  
Margot Alves Nunes Dode
Keyword(s):  
Atomic Force Microscopy ◽  
Epididymal Sperm ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization ◽  
Shape And Size

Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

2008 ◽  
Vol 112 (49) ◽  
pp. 19680-19685 ◽  
Author(s):  
Pavels Birjukovs ◽  
Nikolay Petkov ◽  
Ju Xu ◽  
Janis Svirksts ◽  
John J. Boland ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanowire Arrays ◽  
Bismuth Sulfide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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