Characterization of the Oxygen Ionosorption Effect on a Single SnO2 Nanowire by Using Conductive Atomic Force Microscopy

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.4913 ◽

2012 ◽

Vol 12 (6) ◽

pp. 4864-4867 ◽

Author(s):

Jinhee Heo ◽

Junghwan Lee

Keyword(s):

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications

Solar Energy Materials and Solar Cells ◽

10.1016/j.solmat.2010.12.021 ◽

2011 ◽

Vol 95 (7) ◽

pp. 1949-1954 ◽

Author(s):

B. Galiana ◽

I. Rey-Stolle ◽

I. Beinik ◽

C. Algora ◽

C. Teichert ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Photovoltaic Applications ◽

Antiphase Domains

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Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

Ultramicroscopy ◽

10.1016/j.ultramic.2005.07.003 ◽

2006 ◽

Vol 106 (3) ◽

pp. 191-199 ◽

Author(s):

A. Alexeev ◽

J. Loos ◽

M.M. Koetse

Keyword(s):

Atomic Force Microscopy ◽

Polymer Blends ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Semiconducting Polymer ◽

Force Microscopy ◽

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Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2010.01.005 ◽

2010 ◽

Vol 30 (7) ◽

pp. 1761-1764 ◽

Author(s):

Martin Schloffer ◽

Christian Teichert ◽

Peter Supancic ◽

Andrei Andreev ◽

Yue Hou ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp805422k ◽

2008 ◽

Vol 112 (49) ◽

pp. 19680-19685 ◽

Author(s):

Pavels Birjukovs ◽

Nikolay Petkov ◽

Ju Xu ◽

Janis Svirksts ◽

John J. Boland ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Nanowire Arrays ◽

Bismuth Sulfide ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Electrical characterization of oxygen-induced nanosized ripples on aluminum thin films by conductive atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.07.245 ◽

2006 ◽

Vol 243 (1) ◽

pp. 16-19 ◽

Author(s):

P. Mishra ◽

P. Karmakar ◽

D. Ghose

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Electrical characterization of HgTe nanowires using conductive atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.3512960 ◽

2010 ◽

Vol 108 (11) ◽

pp. 114308 ◽

Author(s):

P. Gundersen ◽

K. O. Kongshaug ◽

E. Selvig ◽

R. Haakenaasen

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Materials Research Bulletin ◽

10.1016/j.materresbull.2015.05.002 ◽

2015 ◽

Vol 70 ◽

pp. 373-378 ◽

Author(s):

N. Muhunthan ◽

Om Pal Singh ◽

Vijaykumar Toutam ◽

V.N. Singh

Keyword(s):

Atomic Force Microscopy ◽

Grain Boundaries ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Czts Thin Films ◽

Microscopy Techniques

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Characterization of Surface Ionic Activity of Proton Conductive Membranes by Conductive Atomic Force Microscopy

Electrochemical and Solid-State Letters ◽

10.1149/1.2154328 ◽

2006 ◽

Vol 9 (2) ◽

pp. A88-A91 ◽

Author(s):

T. Van Nguyen ◽

M. V. Nguyen ◽

G. Lin ◽

N. Rao ◽

X. Xie ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Ionic Activity ◽

Force Microscopy ◽

Atomic Force ◽

Conductive Membranes

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Characterization of local electrical properties of polycrystalline silicon thin films and hydrogen termination effect by conductive atomic force microscopy

Applied Physics Letters ◽

10.1063/1.3130210 ◽

2009 ◽

Vol 94 (18) ◽

pp. 182104 ◽

Author(s):

Emi Machida ◽

Yukiharu Uraoka ◽

Takashi Fuyuki ◽

Ryohei Kokawa ◽

Takeshi Ito ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Polycrystalline Silicon ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Silicon Thin Films ◽

Atomic Force ◽

Hydrogen Termination

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Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.389-393.667 ◽

2002 ◽

Vol 389-393 ◽

pp. 667-670 ◽

Author(s):

Akihiro Yahata ◽

Li Zhang ◽

Takashi Shinohe

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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