Ultraviolet Pulsed Laser-Induced Fluorescence Nonlinearity in Optically Thick Organic Samples

2018 ◽  
Vol 28 (2) ◽  
pp. 689-693 ◽  
Author(s):  
N. A. Maslov
APL Materials ◽  
2016 ◽  
Vol 4 (12) ◽  
pp. 126102 ◽  
Author(s):  
Kasper Orsel ◽  
Rik Groenen ◽  
Bert Bastiaens ◽  
Gertjan Koster ◽  
Guus Rijnders ◽  
...  

1988 ◽  
Vol 129 ◽  
Author(s):  
Masahiro Kawasaki ◽  
Hiroyasu Sato ◽  
Gen Inoue

Pulsed laser irradiation at 248 nm can ablate Si atoms from an Si wafer. The mechanism of this photoablation has been examined by laser-induced fluorescence analysis of the Si products. The Si atoms are measured to leave the wafer surface with averaged translational energy of 2.5 kcal/mol. The distribution of translational energy is well described by the theoretical model for non-cascade ablation processes.


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